41. BS EN IEC 62951-9. Semiconductor devices. Flexible and stretchable semiconductor devices. Part 9. Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells (11th September 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (19 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
42. BS EN IEC 63068-4. Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices. Part 4. Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence (9th July 2021) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (26 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
43. BS EN IEC 63244-1. Semiconductor devices. Semiconductor devices for wireless power transfer and charging. Part 1. General requirements and specifications (13th September 2019) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (34 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
44. BS EN IEC 63364-1. Semiconductor devices. Semiconductor devices for IOT system. Part 1. Test method of sound variation detection (18th June 2021) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (14 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
45. BS IEC 60747-16-9. Semiconductor devices. Part 16-9. Microwave integrated circuits. Phase shifters (3rd September 2021) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (36 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
46. BS IEC 60747-5-4 AMD 1. Semiconductor devices. Part 5-4. Optoelectronic devices. Semiconductor lasers (26th April 2023) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (5 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
47. BS IEC 62047-42. Semiconductor devices. Micro-electromechanical devices. Part 42. Measurement methods of electromechanical conversion characteristics of piezoelectric MEMS cantilever (9th July 2021) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (22 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
48. BS IEC 63150-2. Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment. Part 2. Human arm swing motion (9th July 2021) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (18 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
49. BS IEC 63275-1 Ed.1.0. Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors. Part 1. Test method for bias temperature instability (1st April 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (11 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
50. BS IEC 63275-2 Ed.1.0. Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors. Part 2. Test method for bipolar degradation by body diode operating (1st April 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (11 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗