BS EN IEC 62951-9. Semiconductor devices. Flexible and stretchable semiconductor devices. Part 9. Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells (11th September 2020)

Record Type:: Book
Title:: BS EN IEC 62951-9. Semiconductor devices. Flexible and stretchable semiconductor devices. Part 9. Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells (11th September 2020)
Main Title:: BS EN IEC 62951-9. Semiconductor devices. Flexible and stretchable semiconductor devices.
Authors:: British Standards Institution,
Publisher Details:: London : British Standards Institution
Publication Date:: 2020
Extent:: 1 online resource (19 pages)
Subjects:: 602.1841
Semiconductor devices
Performance testing
Testing methods
Transistors
Resistors
Languages:: English
ISSNs:: 3042-3207
Access Rights:: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
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Physical Locations:: British Library HMNTS - ELD.DS.554622
Ingest File:: 03_174.xml