BS EN IEC 63364-1. Semiconductor devices. Semiconductor devices for IOT system. Part 1. Test method of sound variation detection (18th June 2021)

Record Type:: Book
Title:: BS EN IEC 63364-1. Semiconductor devices. Semiconductor devices for IOT system. Part 1. Test method of sound variation detection (18th June 2021)
Main Title:: BS EN IEC 63364-1. Semiconductor devices. Semiconductor devices for IOT system.
Authors:: British Standards Institution,
Publisher Details:: London : British Standards Institution
Publication Date:: 2021
Extent:: 1 online resource (14 pages)
Subjects:: 602.1841
Semiconductor devices
Semiconductors
Test methods
Evaluation
Electronic equipment and components
Languages:: English
ISSNs:: 3043-2536
Access Rights:: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
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Physical Locations:: British Library HMNTS - ELD.DS.618248
Ingest File:: 05_019.xml