1. 50 nm AlxOy ReRAM program 31% energy, 1.6× endurance, and 3.6× speed improvement by advanced cell condition adaptive verify-reset. (January 2015) Authors: Ning, Sheyang; Iwasaki, Tomoko Ogura; Takeuchi, Ken Journal: Solid-state electronics Issue: Volume 103(2015) Page Start: 64 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. 97.6% array area reduction, ReRAM computation-in-memory with hyperparameter optimization based on memory bit-error rate and bit precision of log-encoding simulated annealing. (1st May 2022) Authors: Misawa, Naoko; Taoka, Kenta; Matsui, Chihiro; Takeuchi, Ken Journal: Japanese journal of applied physics Issue: Volume 61:Number SC(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. A 72% error reduction scheme based on temperature acceleration for long-term data storage applications: Cold flash and millennium memories. (July 2016) Authors: Yamazaki, Senju; Iwasaki, Tomoko Ogura; Hachiya, Shogo; Takahashi, Tomonori; Takeuchi, Ken Journal: Solid-state electronics Issue: Volume 121(2016) Page Start: 25 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. A 72% error reduction scheme based on temperature acceleration for long-term data storage applications: Cold flash and millennium memories. (July 2016) Authors: Yamazaki, Senju; Iwasaki, Tomoko Ogura; Hachiya, Shogo; Takahashi, Tomonori; Takeuchi, Ken Journal: Solid-state electronics Issue: Volume 121(2016) Page Start: 25 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Accuracy of CT Colonography for Detection of Polypoid and Nonpolypoid Neoplasia by Gastroenterologists and Radiologists: A Nationwide Multicenter Study in Japan. (January 2017) Authors: Nagata, Koichi; Endo, Shungo; Honda, Tetsuro; Yasuda, Takaaki; Hirayama, Michiaki; Takahashi, Sho; Kato, Takashi; Horita, Shoichi; Furuya, Ken; Kasai, Kenji; Matsumoto, Hiroshi; Kimura, Yoshiki; Utano, Kenichi; Sugimoto, Hideharu; Kato, Hiroyuki; Yamada, Rieko; Yamamichi, Junta; Shimamoto, Takesh... Journal: American journal of gastroenterology Issue: Volume 112:Number 1(2017) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Advanced error-prediction LDPC with temperature compensation for highly reliable SSDs. (September 2015) Authors: Tokutomi, Tsukasa; Tanakamaru, Shuhei; Iwasaki, Tomoko Ogura; Takeuchi, Ken Journal: Solid-state electronics Issue: Volume 111(2015) Page Start: 129 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Advanced error-prediction LDPC with temperature compensation for highly reliable SSDs. (September 2015) Authors: Tokutomi, Tsukasa; Tanakamaru, Shuhei; Iwasaki, Tomoko Ogura; Takeuchi, Ken Journal: Solid-state electronics Issue: Volume 111(2015) Page Start: 129 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Analysis on applicable error-correcting code strength of storage class memory and NAND flash in hybrid storage. (14th February 2018) Authors: Matsui, Chihiro; Kinoshita, Reika; Takeuchi, Ken Journal: Japanese journal of applied physics Issue: Volume 57:Number 4(2018)Supplement Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Array-level stability enhancement of 50 nm AlxOy ReRAM. (December 2015) Authors: Iwasaki, Tomoko Ogura; Ning, Sheyang; Yamazawa, Hiroki; Takeuchi, Ken Journal: Solid-state electronics Issue: Volume 114(2015) Page Start: 1 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Array-level stability enhancement of 50 nm AlxOy ReRAM. (December 2015) Authors: Iwasaki, Tomoko Ogura; Ning, Sheyang; Yamazawa, Hiroki; Takeuchi, Ken Journal: Solid-state electronics Issue: Volume 114(2015) Page Start: 1 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗