Advanced error-prediction LDPC with temperature compensation for highly reliable SSDs. (September 2015)
- Record Type:
- Journal Article
- Title:
- Advanced error-prediction LDPC with temperature compensation for highly reliable SSDs. (September 2015)
- Main Title:
- Advanced error-prediction LDPC with temperature compensation for highly reliable SSDs
- Authors:
- Tokutomi, Tsukasa
Tanakamaru, Shuhei
Iwasaki, Tomoko Ogura
Takeuchi, Ken - Abstract:
- Highlights: The effects of AEP-LDPC are investigated in a 2×nm TLC NAND Flash memory. Compared with conventional BCH, data-retention time is extended by 12×. AEP-LDPC can correct errors with pre-determined tables made at higher temperature. It is found that one table can cover behavior over a range of temperatures. The total table size can be reduced, which makes this approach more practical. Abstract: To improve the reliability of NAND Flash memory based solid-state drives (SSDs), error-prediction LDPC (EP-LDPC) has been proposed for multi-level-cell (MLC) NAND Flash memory (Tanakamaru et al., 2012, 2013), which is effective for long retention times. However, EP-LDPC is not as effective for triple-level cell (TLC) NAND Flash memory, because TLC NAND Flash has higher error rates and is more sensitive to program-disturb error. Therefore, advanced error-prediction LDPC (AEP-LDPC) has been proposed for TLC NAND Flash memory (Tokutomi et al., 2014). AEP-LDPC can correct errors more accurately by precisely describing the error phenomena. In this paper, the effects of AEP-LDPC are investigated in a 2×nm TLC NAND Flash memory with temperature characterization. Compared with LDPC-with-BER-only, the SSD's data-retention time is increased by 3.4× and 9.5× at room-temperature (RT) and 85 °C, respectively. Similarly, the acceptable BER is increased by 1.8× and 2.3×, respectively. Moreover, AEP-LDPC can correct errors with pre-determined tables made at higher temperatures to shorten theHighlights: The effects of AEP-LDPC are investigated in a 2×nm TLC NAND Flash memory. Compared with conventional BCH, data-retention time is extended by 12×. AEP-LDPC can correct errors with pre-determined tables made at higher temperature. It is found that one table can cover behavior over a range of temperatures. The total table size can be reduced, which makes this approach more practical. Abstract: To improve the reliability of NAND Flash memory based solid-state drives (SSDs), error-prediction LDPC (EP-LDPC) has been proposed for multi-level-cell (MLC) NAND Flash memory (Tanakamaru et al., 2012, 2013), which is effective for long retention times. However, EP-LDPC is not as effective for triple-level cell (TLC) NAND Flash memory, because TLC NAND Flash has higher error rates and is more sensitive to program-disturb error. Therefore, advanced error-prediction LDPC (AEP-LDPC) has been proposed for TLC NAND Flash memory (Tokutomi et al., 2014). AEP-LDPC can correct errors more accurately by precisely describing the error phenomena. In this paper, the effects of AEP-LDPC are investigated in a 2×nm TLC NAND Flash memory with temperature characterization. Compared with LDPC-with-BER-only, the SSD's data-retention time is increased by 3.4× and 9.5× at room-temperature (RT) and 85 °C, respectively. Similarly, the acceptable BER is increased by 1.8× and 2.3×, respectively. Moreover, AEP-LDPC can correct errors with pre-determined tables made at higher temperatures to shorten the measurement time before shipping. Furthermore, it is found that one table can cover behavior over a range of temperatures in AEP-LDPC. As a result, the total table size can be reduced to 777 kBytes, which makes this approach more practical. … (more)
- Is Part Of:
- Solid-state electronics. Volume 111(2015)
- Journal:
- Solid-state electronics
- Issue:
- Volume 111(2015)
- Issue Display:
- Volume 111, Issue 2015 (2015)
- Year:
- 2015
- Volume:
- 111
- Issue:
- 2015
- Issue Sort Value:
- 2015-0111-2015-0000
- Page Start:
- 129
- Page End:
- 140
- Publication Date:
- 2015-09
- Subjects:
- NAND Flash memory -- Solid-state drive (SSD) -- Low-density-parity-check (LDPC) -- Error-correcting code (ECC)
Semiconductors -- Periodicals
Semiconducteurs -- Périodiques
621.38152 - Journal URLs:
- http://www.sciencedirect.com/science/journal/00381101 ↗
http://www.elsevier.com/journals ↗ - DOI:
- 10.1016/j.sse.2015.05.034 ↗
- Languages:
- English
- ISSNs:
- 0038-1101
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 8327.385000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 9757.xml