1. Anisotropic Biaxial Strain Evaluation in Carbon-Doped Silicon Using Water-Immersion Raman Spectroscopy. (3rd July 2019) Authors: Yoshioka, Kazutoshi; Yokogawa, Ryo; Sawamoto, Naomi; Ogura, Atsushi Journal: ECS transactions Issue: Volume 92:Number 4(2019) Page Start: 33 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Band gap-tuned MoS2(1−x)Te2x thin films synthesized by a hybrid Co-sputtering and post-deposition tellurization annealing process. Issue 16 (10th August 2017) Authors: Hibino, Yusuke; Ishihara, Seiya; Sawamoto, Naomi; Ohashi, Takumi; Matsuura, Kentarou; Machida, Hideaki; Wakabayashi, Hitoshi; Ogura, Atsushi Journal: Journal of materials research Issue: Volume 32:Issue 16(2017) Page Start: 3021 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Biaxial Stress Evaluation in SiGe Epitaxially Grown on Ge Substrate by Oil-Immersion Raman Spectroscopy. (14th September 2015) Authors: Takeuchi, Kazuma; Kosemura, Daisuke; Yamamoto, Shotaro; Tomita, Motohiro; Usuda, Koji; Sawamoto, Naomi; Ogura, Atsushi Journal: ECS transactions Issue: Volume 69:Number 10(2015) Page Start: 81 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Crystallinity Evaluation of Low Temperature Polycrystalline Silicon Thin Film Using UV/Visible Raman Spectroscopy. (4th May 2016) Authors: Yokogawa, Ryo; Takahashi, Kazuya; Komori, Katsuhiko; Hirota, Yoshihiro; Sawamoto, Naomi; Ogura, Atsushi Journal: ECS transactions Issue: Volume 72:Number 4(2016) Page Start: 249 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Determination of Phonon Deformation Potentials in Carbon-Doped Silicon. (20th July 2018) Authors: Yoshioka, Kazutoshi; Yokogawa, Ryo; Murakami, Tatsumi; Komago, Shota; Sawamoto, Naomi; Ogura, Atsushi Journal: ECS transactions Issue: Volume 86:Number 7(2018) Page Start: 419 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Evaluation of Thermal Conductivity Characteristics in Polycrystalline Silicon - The Effect of Nanostructure in the Grains. (8th September 2020) Authors: Takeuchi, Haruki; Yokogawa, Ryo; Takahashi, Kazuya; Komori, Katsuhiko; Morimoto, Tamotsu; Sawamoto, Naomi; Ogura, Atsushi Journal: ECS transactions Issue: Volume 98:Number 5(2020) Page Start: 437 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Ferroelectricity of HfxZr1−xO2 Thin Films Fabricated Using TiN Stressor and ZrO2 Nucleation Techniques. (20th July 2018) Authors: Onaya, Takashi; Nabatame, Toshihide; Sawamoto, Naomi; Kurishima, Kazunori; Ohi, Akihiko; Ikeda, Naoki; Nagata, Takahiro; Ogura, Atsushi Journal: ECS transactions Issue: Volume 86:Number 6(2018) Page Start: 31 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Growth of Ge Homoepitaxial Films by Metal-Organic Chemical Vapor Deposition Using t-C4H9GeH3. (17th March 2015) Authors: Suda, Kohei; Kijima, Takahiro; Ishihara, Seiya; Sawamoto, Naomi; Machida, Hideaki; Ishikawa, Masato; Sudoh, Hiroshi; Ohshita, Yoshio; Ogura, Atsushi Journal: ECS journal of solid state science and technology Issue: Volume 4:Number 5(2015) Page Start: P152 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Growth of Ge Homoepitaxial Films by Metal-Organic Chemical Vapor Deposition Using t-C4H9GeH3. (1st January 2015) Authors: Suda, Kohei; Kijima, Takahiro; Ishihara, Seiya; Sawamoto, Naomi; Machida, Hideaki; Ishikawa, Masato; Sudoh, Hiroshi; Ohshita, Yoshio; Ogura, Atsushi Journal: ECS journal of solid state science and technology Issue: Volume 4:Number 5(2015) Page Start: P152 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Improvement in ferroelectricity of HfxZr1−xO2 thin films using ZrO2 seed layer. (13th July 2017) Authors: Onaya, Takashi; Nabatame, Toshihide; Sawamoto, Naomi; Ohi, Akihiko; Ikeda, Naoki; Chikyow, Toyohiro; Ogura, Atsushi Journal: Applied physics express Issue: Volume 10:Number 8(2017) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗