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1. Annealing and LEEBI Effects on the Stacking Fault Expansion and Shrinking in 4H‐SiC. Issue 17 (29th May 2019)

2. Application of the Concept of Lifetime‐Equivalent Defect Density in Defect Systems Comprising a Multitude of Defect Species. Issue 17 (12th August 2019)

3. Boron–Oxygen Complex Responsible for Light‐Induced Degradation in Silicon Photovoltaic Cells: A New Insight into the Problem. Issue 17 (12th August 2019)

5. Detection of Sulfur‐Related Defects in Sulfur Diffused n‐ and p‐Type Si by DLTS. Issue 17 (4th June 2019)

7. Diffusion of Phosphorus and Boron from Atomic Layer Deposition Oxides into Silicon. Issue 17 (7th August 2019)

8. Dissociation and Formation Kinetics of Iron–Boron Pairs in Silicon after Phosphorus Implantation Gettering. Issue 17 (14th August 2019)

10. Estimations of Low Temperature Dislocation Mobility in GaN. Issue 17 (28th May 2019)