1. Drain current local variability from linear to saturation region in 28 nm bulk NMOSFETs. (February 2017) Authors: Karatsori, T.A.; Theodorou, C.G.; Haendler, S.; Dimitriadis, C.A.; Ghibaudo, G. Journal: Solid-state electronics Issue: Volume 128(2017) Page Start: 31 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Influence of AC signal oscillator level on effective mobility measurement by split C–V technique in MOSFETs. Issue 17 (1st August 2016) Authors: Karatsori, T.A.; Theodorou, C.G.; Dimitriadis, C.A.; Ghibaudo, G. Journal: Electronics letters Issue: Volume 52:Issue 17(2016) Page Start: 1492 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Threshold voltage of p-type triple-gate junctionless transistors. (November 2022) Authors: Oproglidis, T.A.; Tassis, D.H.; Tsormpatzoglou, A.; Karatsori, T.A.; Theodorou, C.G.; Barraud, S.; Ghibaudo, G.; Dimitriadis, C.A. Journal: Solid-state electronics Issue: Volume 197(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Continuous and symmetric trans-capacitance compact model for triple-gate junctionless MOSFETs. (January 2021) Authors: Oproglidis, T.A.; Tsormpatzoglou, A.; Tassis, D.H.; Theodorou, C.G.; Ghibaudo, G.; Dimitriadis, C.A. Journal: Solid-state electronics Issue: Volume 175(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Impact of low‐frequency noise variability on statistical parameter extraction in ultra‐scaled CMOS devices. Issue 19 (1st September 2014) Authors: Ioannidis, E.G.; Theodorou, C.G.; Haendler, S.; Dimitriadis, C.A.; Ghibaudo, G. Journal: Electronics letters Issue: Volume 50:Issue 19(2014) Page Start: 1393 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Impact of dynamic variability on the operation of CMOS inverter. Issue 19 (1st September 2013) Authors: Ioannidis, E.G.; Haendler, S.; Manceau, J.‐P.; Dimitriadis, C.A.; Ghibaudo, G. Journal: Electronics letters Issue: Volume 49:Issue 19(2013) Page Start: 1214 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Corrigendum to "Drain current local variability analysis in nanoscale junctionless FinFETs utilizing a compact model" [Solid-State Electron. 170 (2020) 107835]. (September 2020) Authors: Oproglidis, T.A.; Tassis, D.H.; Tsormpatzoglou, A.; Ghibaudo, G.; Dimitriadis, C.A. Journal: Solid-state electronics Issue: Volume 171(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Low frequency noise variability in ultra scaled FD-SOI n-MOSFETs: Dependence on gate bias, frequency and temperature. (March 2016) Authors: Theodorou, C.G.; Ioannidis, E.G.; Haendler, S.; Josse, E.; Dimitriadis, C.A.; Ghibaudo, G. Journal: Solid-state electronics Issue: Volume 117(2016) Page Start: 88 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Drain current local variability analysis in nanoscale junctionless FinFETs utilizing a compact model. (August 2020) Authors: Oproglidis, T.A.; Tassis, D.H.; Tsormpatzoglou, A.; Ghibaudo, G.; Dimitriadis, C.A. Journal: Solid-state electronics Issue: Volume 170(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Leakage current conduction in metal gate junctionless nanowire transistors. (May 2017) Authors: Oproglidis, T.A.; Karatsori, T.A.; Barraud, S.; Ghibaudo, G.; Dimitriadis, C.A. Journal: Solid-state electronics Issue: Volume 131(2017) Page Start: 20 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗