Corrigendum to "Drain current local variability analysis in nanoscale junctionless FinFETs utilizing a compact model" [Solid-State Electron. 170 (2020) 107835]. (September 2020)

Record Type:: Journal Article
Title:: Corrigendum to "Drain current local variability analysis in nanoscale junctionless FinFETs utilizing a compact model" [Solid-State Electron. 170 (2020) 107835]. (September 2020)
Main Title:: Corrigendum to "Drain current local variability analysis in nanoscale junctionless FinFETs utilizing a compact model" [Solid-State Electron. 170 (2020) 107835]
Authors:: Oproglidis, T.A.
Tassis, D.H.
Tsormpatzoglou, A.
Ghibaudo, G.
Dimitriadis, C.A.
Abstract:
Is Part Of:: Solid-state electronics. Volume 171(2020)
Journal:: Solid-state electronics
Issue:: Volume 171(2020)
Issue Display:: Volume 171, Issue 2020 (2020)
Year:: 2020
Volume:: 171
Issue:: 2020
Issue Sort Value:: 2020-0171-2020-0000
Page Start:
Page End:
Publication Date:: 2020-09
Subjects:: Semiconductors -- Periodicals
Semiconducteurs -- Périodiques
621.38152
Journal URLs:: http://www.sciencedirect.com/science/journal/00381101 ↗
http://www.elsevier.com/journals ↗
DOI:: 10.1016/j.sse.2020.107865 ↗
Languages:: English
ISSNs:: 0038-1101
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library DSC - 8327.385000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store
Ingest File:: 14017.xml