Impact of low‐frequency noise variability on statistical parameter extraction in ultra‐scaled CMOS devices. Issue 19 (1st September 2014)

• Record Type: Journal Article
• Authors: Ioannidis, E.G.; Theodorou, C.G.; Haendler, S.; Dimitriadis, C.A.; Ghibaudo, G.
• Is Part Of: Electronics letters. Volume 50:Issue 19(2014)
• Page Start: 1393
• Page End: 1395
• Publication Date: 2014-09-01
• Subjects: CMOS integrated circuits -- log normal distribution -- Monte Carlo methods -- circuit simulation; low‐frequency noise variability -- statistical parameter extraction -- ultra‐scaled CMOS devices -- noise level dispersion -- log normal statistical distribution -- mean values -- linear data -- median values -- log noise data -- LFN characterisation issues -- Monte Carlo variability circuit simulation; Electronics -- Periodicals; 621.381
• DOI: 10.1049/el.2014.1837
• Languages: English
• ISSNs: 0013-5194

Abstract

Abstract : The impact on the extracted low‐frequency noise (LFN) parameter values due to LFN variability in CMOS devices is investigated. First, it is demonstrated that the noise level dispersion follows a log normal statistical distribution. Then, based on this feature, it is explained why the mean values from the linear data are different from the mean values (or median values) calculated from the log noise data. Finally, the consequence of this finding in terms of LFN characterisation issues and Monte Carlo LFN variability circuit simulation is discussed.