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- 621.38152 19
- Semiconducteurs -- Périodiques 19
- Semiconductors -- Periodicals 19
- 2DEG -- AlGaN/GaN HEMT -- DoS (Density of States) -- Gate leakage current -- Interface traps -- Thermionic emission -- Trap-Assisted Tunneling (TAT) 1
- AlGaAs/InGaAs/GaAs based pHEMTs -- 3-D MMICs -- Multilayer fabrication -- Characterisation -- Thermal influence 1
- Broadband phase detector -- Phase locked loop (PLL) -- MEMS -- Modeling 1
- Carrier gas -- p-GaN -- Wall-plug efficiency -- Current spreading 1
- Diode -- PCM -- Dual trench isolation -- Disturbance current -- Drive current -- Scaling down 1
- FinFET -- Ion implantation -- Parasitic resistance -- Variability -- Crystal defects 1
- Gradual resistance switching -- RRAM -- Pulse operation -- Synaptic device 1