Is Part Of: Microelectronics and reliability. Volume 61(2016) - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Is Part Of Microelectronics and reliability. Volume 61(2016)

1. 300-V class power n-channel LDMOS transistor implemented in 0.18-μm silicon-on-insulator (SOI) technology. (June 2016)

Authors:: Zhang, Shuai; Tuan, Hsiao-Chin; Wu, Xiao-Jing; Shi, Lei; Wu, Jian
Journal:: Microelectronics and reliability
Issue:: Volume 61(2016)
Page Start:: 125
Record Type:: Journal Article
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2. A cross layer approach for efficient thermal management in 3D stacked SoCs. (June 2016)

Authors:: Jung, Matthias; Weis, Christian; Wehn, Norbert
Journal:: Microelectronics and reliability
Issue:: Volume 61(2016)
Page Start:: 43
Record Type:: Journal Article
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3. A review on the humidity reliability of high power white light LEDs. (June 2016)

Authors:: Singh, Preetpal; Tan, Cher Ming
Journal:: Microelectronics and reliability
Issue:: Volume 61(2016)
Page Start:: 129
Record Type:: Journal Article
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4. A step-accurate model for the trapping and release of charge carriers suitable for the transient simulation of analog circuits. (June 2016)

Authors:: Habal, Husni; Graeb, Helmut
Journal:: Microelectronics and reliability
Issue:: Volume 61(2016)
Page Start:: 17
Record Type:: Journal Article
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5. Comparative study of reliability degradation behaviors of LDMOS and LDMOS-SCR ESD protection devices. (June 2016)

Authors:: Yu, Zhihui; Jin, Hao; Dong, Shurong; Wong, Hei; Zeng, Jie; Wang, Weihuai
Journal:: Microelectronics and reliability
Issue:: Volume 61(2016)
Page Start:: 111
Record Type:: Journal Article
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6. Comparison of electrical characteristics between AlGaN/GaN and lattice-matched InAlN/GaN heterostructure Schottky barrier diodes. (June 2016)

Authors:: Ren, Jian; Yan, Dawei; Zhai, Yang; Mou, Wenjie; Gu, Xiaofeng
Journal:: Microelectronics and reliability
Issue:: Volume 61(2016)
Page Start:: 82
Record Type:: Journal Article
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7. Compliance current dominates evolution of NiSi2 defect size in Ni/dielectric/Si RRAM devices. (June 2016)

Authors:: Mei, Sen; Bosman, Michel; Nagarajan, Raghavan; Wu, Xing; Pey, Kin Leong
Journal:: Microelectronics and reliability
Issue:: Volume 61(2016)
Page Start:: 71
Record Type:: Journal Article
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8. Copper induced synthesis of graphene using amorphous carbon. (June 2016)

Authors:: Narula, Udit; Tan, Cher Ming; Lai, Chao Sung
Journal:: Microelectronics and reliability
Issue:: Volume 61(2016)
Page Start:: 87
Record Type:: Journal Article
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9. Design and optimization of LDMOS-SCR devices with improved ESD protection performance. (June 2016)

Authors:: Liang, Hailian; Cao, Huafeng; Gu, Xiaofeng; Guo, Zixiang
Journal:: Microelectronics and reliability
Issue:: Volume 61(2016)
Page Start:: 115
Record Type:: Journal Article
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10. Early degradation of high power packaged LEDs under humid conditions and its recovery — Myth of reliability rejuvenation. (June 2016)

Authors:: Singh, Preetpal; Tan, Cher Ming; Chang, Liann-Be
Journal:: Microelectronics and reliability
Issue:: Volume 61(2016)
Page Start:: 145
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗