1. A dual-rail compact defect-tolerant multiplexer. Issue 3 (February 2015) Authors: Ben Dhia, A.; Slimani, M.; Cai, H.; de B. Naviner, L.A. Journal: Microelectronics and reliability Issue: Volume 55:Issue 3/4(2015) Page Start: 662 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A new mixed hardening methodology applied to a 28 nm FDSOI 32-bits DSP subjected to gamma radiation. (November 2021) Authors: Acuña, A. Ureña; Armani, J.M.; Slimani, M.; Miro-Panades, I.; Dollfus, P. Journal: Microelectronics and reliability Issue: Volume 126(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. A novel analytical method for defect tolerance assessment. Issue 9 (August 2015) Authors: Slimani, M.; Ben Dhia, A.; Naviner, L. Journal: Microelectronics and reliability Issue: Volume 55:Issue 9/10(2015) Page Start: 1285 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. A process-variation-resilient methodology of circuit design by using asymmetrical forward body bias in 28 nm FDSOI. (September 2016) Authors: Wang, Y.; Cai, H.; Naviner, L.A.B.; Zhao, X.X.; Zhang, Y.; Slimani, M.; Klein, J.O.; Zhao, W.S. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 26 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. A process-variation-resilient methodology of circuit design by using asymmetrical forward body bias in 28 nm FDSOI. (September 2016) Authors: Wang, Y.; Cai, H.; Naviner, L.A.B.; Zhao, X.X.; Zhang, Y.; Slimani, M.; Klein, J.O.; Zhao, W.S. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 26 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Analysis of ageing effects on ARTIX7 XILINX FPGA. (September 2017) Authors: Slimani, M.; Benkalaia, K.; Naviner, L. Journal: Microelectronics and reliability Issue: Volume 76/77(2017) Page Start: 168 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Reliability analysis of hybrid spin transfer torque magnetic tunnel junction/CMOS majority voters. (September 2016) Authors: Slimani, M.; Butzen, P.; Naviner, L.; Wang, Y.; Cai, H. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 48 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Reliability analysis of hybrid spin transfer torque magnetic tunnel junction/CMOS majority voters. (September 2016) Authors: Slimani, M.; Butzen, P.; Naviner, L.; Wang, Y.; Cai, H. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 48 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Reliable majority voter based on spin transfer torque magnetic tunnel junction device. Issue 1 (1st January 2016) Authors: Butzen, P.F.; Slimani, M.; Wang, Y.; Cai, H.; Naviner, L.A.B. Journal: Electronics letters Issue: Volume 52:Issue 1(2016) Page Start: 47 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Sublingual hematoma under oral anticoagulants. Issue 8 (2015) Authors: Salmi, A.; Slimani, M.; Messaif, D. Journal: Clinical case reports and reviews Issue: Volume 1:Issue 8(2015) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗