Analysis of ageing effects on ARTIX7 XILINX FPGA. (September 2017)

• Record Type: Journal Article
• Authors: Slimani, M.; Benkalaia, K.; Naviner, L.
• Is Part Of: Microelectronics and reliability. Volume 76/77(2017)
• Page Start: 168
• Page End: 173
• Publication Date: 2017-09
• Subjects: Ageing degradation -- FPGA -- LUT -- NBTI -- HCI; Electronic apparatus and appliances -- Reliability -- Periodicals; Miniature electronic equipment -- Periodicals; Appareils électroniques -- Fiabilité -- Périodiques; Équipement électronique miniaturisé -- Périodiques; Electronic apparatus and appliances -- Reliability; Miniature electronic equipment; Periodicals; 621.3815
• DOI: 10.1016/j.microrel.2017.07.006
• Languages: English
• ISSNs: 0026-2714

Abstract

Abstract: FPGAs are considered as an attractive alternative to ASICs, thanks to their reconfigurability and their low development costs. However, since they are the first experiencing new technology nodes, their ability to tackle VLSI ageing mechanisms is crucial, especially in critical applications such as space and avionics ones. This work aims to understand ageing degradation on FPGAs. An experimental approach is adopted in order to characterize the effects of degradation on FPGAs Look up tables (LUTs). Different stress conditions were tested to accelerate ageing process and identify the mechanisms behind. Ageing tests have been executed on a total of 17 FPGAs belonging to Artix7 XILINX family. Results show that Negative-Bias Temperature Instability ageing damage is the main cause of timing degradation on the studied FPGAs. Highlights: We add a background section explaining the most important ageing mechanisms. We add Fig. 8 illustrating the damage recovery of the NBTI after relaxation. We extract the power-law time exponent parameter of the well-known power law relationship to time of the NBTI degradation by interpolating our measurements.