A new mixed hardening methodology applied to a 28 nm FDSOI 32-bits DSP subjected to gamma radiation. (November 2021)

• Record Type: Journal Article
• Authors: Acuña, A. Ureña; Armani, J.M.; Slimani, M.; Miro-Panades, I.; Dollfus, P.
• Is Part Of: Microelectronics and reliability. Volume 126(2021)
• Publication Date: 2021-11
• Subjects: FDSOI -- TID -- Thermal regeneration -- Electric compensation -- Hardening reliability; Electronic apparatus and appliances -- Reliability -- Periodicals; Miniature electronic equipment -- Periodicals; Appareils électroniques -- Fiabilité -- Périodiques; Équipement électronique miniaturisé -- Périodiques; Electronic apparatus and appliances -- Reliability; Miniature electronic equipment; Periodicals; 621.3815
• DOI: 10.1016/j.microrel.2021.114397
• Languages: English
• ISSNs: 0026-2714

Abstract

Abstract: This work presents the performance degradation of a 32-bit DSP fabricated with 28 nm FDSOI technology subjected to different levels of gamma radiation. A new mixed hardening methodology based on electrical compensation and thermal regeneration is applied to the irradiated devices to recover the degraded electrical characteristics induced by the total ionizing dose. The application of this new methodology seeks to extend the lifetime of FDSOI integrated circuits under high radiation conditions while keeping good reliability. Highlights: Radiation effects of FDSOI DSP Thermal regeneration of the degraded performances Electrical compensation of the degraded performances Mixed hardening methodology including thermal regeneration and electrical compensation