A dual-rail compact defect-tolerant multiplexer. Issue 3 (February 2015)

• Record Type: Journal Article
• Authors: Ben Dhia, A.; Slimani, M.; Cai, H.; de B. Naviner, L.A.
• Is Part Of: Microelectronics and reliability. Volume 55:Issue 3/4(2015)
• Page Start: 662
• Page End: 670
• Publication Date: 2015-02
• Subjects: Permanent faults -- Defect modeling -- Defect tolerance -- FPGA look-up table -- Aging-aware analysis; Electronic apparatus and appliances -- Reliability -- Periodicals; Miniature electronic equipment -- Periodicals; Appareils électroniques -- Fiabilité -- Périodiques; Équipement électronique miniaturisé -- Périodiques; Electronic apparatus and appliances -- Reliability; Miniature electronic equipment; Periodicals; 621.3815
• DOI: 10.1016/j.microrel.2015.01.011
• Languages: English
• ISSNs: 0026-2714

Abstract

Highlights: We explore robustness of dual-rail and single-ended multiplexer structures. We compare different multiplexer architectures using a suitable design metric. Robustness gain using DCVS multiplexers in a LUT is evaluated. We studied the effect of aging phenomena on the proposed DCVS multiplexer. Abstract: As the dimensions of CMOS devices scale down to the nanometers, manufacturing defects are becoming a challenging concern in current and future technologies. This work aims at improving defect tolerance in FPGAs which are certainly affected by technology downsizing. Since the cornerstone of the FPGA logic and interconnect resources is the multiplexer, we propose a defect-tolerant multiplexer architecture based on differential logic. This architecture proved to be more resilient to single defects (opens and bridges) than its single-ended standard counterpart and more compact than existing hardened architectures. The architectures were studied under single defect injection by a tool that models several possible defects for a given design according to its extracted netlist. The robustness gain using differential logic was assessed for different sizes of FPGA look-up tables. Eventually, three different aging phenomena resulting in device wear-out were examined. An aging-aware analysis was performed according to an appropriate simulation flow. Results were given for the proposed multiplexer architecture and its standard counterpart.