1. A physical unclonable function based on a 2‐transistor subthreshold voltage divider. (18th November 2016) Authors: De Rose, Raffaele; Crupi, Felice; Lanuzza, Marco; Albano, Domenico Other Names: Acosta Antonio guestEditor.; Addabbo Tommaso guestEditor. Journal: International journal of circuit theory and applications Issue: Volume 45:Number 2(2017:Feb.) Page Start: 260 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A picopower temperature‐compensated, subthreshold CMOS voltage reference. (10th June 2013) Authors: Albano, Domenico; Crupi, Felice; Cucchi, Francesca; Iannaccone, Giuseppe Journal: International journal of circuit theory and applications Issue: Volume 42:Number 12(2014:Dec.) Page Start: 1306 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. A portable class of 3‐transistor current references with low‐power sub‐0.5 V operation. (20th December 2017) Authors: Crupi, Felice; De Rose, Raffaele; Paliy, Maksym; Lanuzza, Marco; Perna, Mattia; Iannaccone, Giuseppe Journal: International journal of circuit theory and applications Issue: Volume 46:Number 4(2018) Page Start: 779 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. A sub‐1 V nanopower temperature‐compensated sub‐threshold CMOS voltage reference with 0.065%/V line sensitivity. (20th September 2013) Authors: Magnelli, Luca; Crupi, Felice; Corsonello, Pasquale; Iannaccone, Giuseppe Journal: International journal of circuit theory and applications Issue: Volume 43:Number 4(2015:Apr.) Page Start: 421 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Adjusting thermal stability in double-barrier MTJ for energy improvement in cryogenic STT-MRAMs. (August 2022) Authors: Garzón, Esteban; De Rose, Raffaele; Crupi, Felice; Trojman, Lionel; Teman, Adam; Lanuzza, Marco Journal: Solid-state electronics Issue: Volume 194(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Assessment of 2D-FET Based Digital and Analog Circuits on Paper. (November 2021) Authors: Vatalaro, Massimo; De Rose, Raffaele; Lanuzza, Marco; Iannaccone, Giuseppe; Crupi, Felice Journal: Solid-state electronics Issue: Volume 185(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Assessment of paper-based MoS2 FET for Physically Unclonable Functions. (August 2022) Authors: Vatalaro, Massimo; De Rose, Raffaele; Lanuzza, Marco; Magnone, Paolo; Conti, Silvia; Iannaccone, Giuseppe; Crupi, Felice Journal: Solid-state electronics Issue: Volume 194(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. BTI saturation and universal relaxation in SiC power MOSFETs. (June 2020) Authors: Sánchez, Luis; Acurio, Eliana; Crupi, Felice; Reggiani, Susanna; Meneghesso, Gaudenzio Journal: Microelectronics and reliability Issue: Volume 109(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Design of a 75‐nW, 0.5‐V subthreshold complementary metal–oxide–semiconductor operational amplifier‡. (3rd January 2013) Authors: Magnelli, Luca; Amoroso, Francesco A.; Crupi, Felice; Cappuccino, Gregorio; Iannaccone, Giuseppe Journal: International journal of circuit theory and applications Issue: Volume 42:Number 9(2014:Sep.) Page Start: 967 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Electrical Characterization of the Influence of the Annealing Energy Density on Carrier Lifetimes in Germanium. (1st January 2016) Authors: Filippone, Bruno; Donaldson, Conor; Shayesteh, Maryam; O'Connell, Dan; Huet, Karim; Toqué-Tresonne, Ines; Crupi, Felice; Duffy, Ray Journal: ECS journal of solid state science and technology Issue: Volume 5:Number 4(2016) Page Start: P3013 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗