A portable class of 3‐transistor current references with low‐power sub‐0.5 V operation. (20th December 2017)
- Record Type:
- Journal Article
- Title:
- A portable class of 3‐transistor current references with low‐power sub‐0.5 V operation. (20th December 2017)
- Main Title:
- A portable class of 3‐transistor current references with low‐power sub‐0.5 V operation
- Authors:
- Crupi, Felice
De Rose, Raffaele
Paliy, Maksym
Lanuzza, Marco
Perna, Mattia
Iannaccone, Giuseppe - Abstract:
- Summary: This work proposes a new class of current references based on only 3 transistors that allows sub‐0.5 V operation. The circuit consists of a 2‐transistor block that generates a proportional‐to‐absolute‐temperature or a complementary‐to‐absolute‐temperature voltage and a load transistor. The idea of a 3T current reference is validated by circuit simulations for different complementary metal‐oxide‐semiconductor technologies and by experimental measurements on a large set of test chips fabricated with a commercial 0.18 μm complementary metal‐oxide‐semiconductor process. As compared to the state‐of‐art competitors, the 3T current reference exhibits competitive performance in terms of temperature coefficient (578 ppm/°C), line sensitivity (3.9%/V), and power consumption (213 nW) and presents a reduction by a factor of 2 to 3 in terms of minimum operating voltage (0.45 V) and an improvement of 1 to 2 orders of magnitude in terms of area occupation (750 μm 2 ). In spite of the extremely reduced silicon area, the fabricated chips exhibit low‐process sensitivity (2.7%). A digital trimming solution to significantly reduce the process sensitivity is also presented and validated by simulations. Abstract : This work proposes a new class of current references based on only 3 transistors that allows sub‐0.5 V operation. The circuit consists of a 2‐transistor block that generates a proportional‐to‐absolute temperature or a complementary‐to‐absolute‐temperature voltage and a loadSummary: This work proposes a new class of current references based on only 3 transistors that allows sub‐0.5 V operation. The circuit consists of a 2‐transistor block that generates a proportional‐to‐absolute‐temperature or a complementary‐to‐absolute‐temperature voltage and a load transistor. The idea of a 3T current reference is validated by circuit simulations for different complementary metal‐oxide‐semiconductor technologies and by experimental measurements on a large set of test chips fabricated with a commercial 0.18 μm complementary metal‐oxide‐semiconductor process. As compared to the state‐of‐art competitors, the 3T current reference exhibits competitive performance in terms of temperature coefficient (578 ppm/°C), line sensitivity (3.9%/V), and power consumption (213 nW) and presents a reduction by a factor of 2 to 3 in terms of minimum operating voltage (0.45 V) and an improvement of 1 to 2 orders of magnitude in terms of area occupation (750 μm 2 ). In spite of the extremely reduced silicon area, the fabricated chips exhibit low‐process sensitivity (2.7%). A digital trimming solution to significantly reduce the process sensitivity is also presented and validated by simulations. Abstract : This work proposes a new class of current references based on only 3 transistors that allows sub‐0.5 V operation. The circuit consists of a 2‐transistor block that generates a proportional‐to‐absolute temperature or a complementary‐to‐absolute‐temperature voltage and a load transistor. The idea of a 3T current reference is validated by circuit simulations for different complementary metal oxide semiconductor technologies and by experimental measurements on a large set of test chips fabricated with a commercial 0.18 μm complementary metal oxide semiconductor process. As compared to the state‐of‐art competitors, the 3T current reference exhibits competitive performance in terms of temperature coefficient (578 ppm/°C), line sensitivity (3.9%/V), and power consumption (213 nW) and presents a reduction by a factor of 2 to 3 in terms of minimum operating voltage (0.45 V) and an improvement of 1 to 2 orders of magnitude in terms of area occupation (750 μm 2 ). In spite of the extremely reduced silicon area, the fabricated chips exhibit low‐process sensitivity (2.7%). A digital trimming solution to significantly reduce the process sensitivity is also presented and validated by simulations. … (more)
- Is Part Of:
- International journal of circuit theory and applications. Volume 46:Number 4(2018)
- Journal:
- International journal of circuit theory and applications
- Issue:
- Volume 46:Number 4(2018)
- Issue Display:
- Volume 46, Issue 4 (2018)
- Year:
- 2018
- Volume:
- 46
- Issue:
- 4
- Issue Sort Value:
- 2018-0046-0004-0000
- Page Start:
- 779
- Page End:
- 795
- Publication Date:
- 2017-12-20
- Subjects:
- CMOS analog design -- current reference -- Internet of things (IoT) -- low‐power -- low‐voltage
Electric circuit analysis -- Periodicals
621.319205 - Journal URLs:
- http://onlinelibrary.wiley.com/ ↗
- DOI:
- 10.1002/cta.2439 ↗
- Languages:
- English
- ISSNs:
- 0098-9886
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 4542.167000
British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store - Ingest File:
- 6285.xml