BTI saturation and universal relaxation in SiC power MOSFETs. (June 2020)

• Record Type: Journal Article
• Authors: Sánchez, Luis; Acurio, Eliana; Crupi, Felice; Reggiani, Susanna; Meneghesso, Gaudenzio
• Is Part Of: Microelectronics and reliability. Volume 109(2020)
• Publication Date: 2020-06
• Subjects: De-trapping -- PBTI -- Recovery -- Universal relaxation -- SiC -- Trapping -- Zafar's model; Electronic apparatus and appliances -- Reliability -- Periodicals; Miniature electronic equipment -- Periodicals; Appareils électroniques -- Fiabilité -- Périodiques; Équipement électronique miniaturisé -- Périodiques; Electronic apparatus and appliances -- Reliability; Miniature electronic equipment; Periodicals; 621.3815
• DOI: 10.1016/j.microrel.2020.113642
• Languages: English
• ISSNs: 0026-2714

Abstract

Abstract: This work focuses on the positive bias temperature instability of SiC-based MOSFETs under different stress voltages and temperatures. Stress experiments demonstrate that the threshold voltage shift (∆ V th ) does not follow a conventional power law for long stress time, but exhibits a saturating log- time dependence attributed to the charge trapping in the pre-existing defects at the SiC/SiO2 interface or in the SiO2 layer. The maximum V th shift (∆ V max ), which is a function of the total trap density, increases with the stress voltage ( V stress ) and decreases for temperatures higher than 50 °C. The time constant of the traps ( τ 0 ) also shows an uptrend with V stress with a maximum value of around 50 °C. Moreover, the trap energy distribution ( γ ) slightly increases with temperature. The recovery analysis shows that an empiric universal relaxation function well describes the data with a dispersion parameter ( β ) that follows the Arrhenius law. Finally, the V th recovery, after the same V stress, is enhanced with temperature and also depicts a linear behavior on the Arrhenius plot. This indicates that the charge de-trapping process is thermally activated and explains the low degradation observed at high temperatures during the stress phase. Highlights: Recoverable threshold voltage degradation under different stress conditions. The threshold voltage shift shows a saturating log-time dependence attributed to charge trapping in the pre-existing defects. The charge de-trapping is thermally activated and explains the low degradation at high temperatures during the stress phase. An empiric universal relaxation function well describes the recovery data.