1. (Invited) Advanced Semiconductor Devices for Future CMOS Technologies. (27th March 2015) Authors: Claeys, Cor; Chiappe, Danielle; Collaert, Nadine; Mitard, Jerome; Radu, Juliana; Rooyackers, Rita; Simoen, Eddy; Vandooren, Anne; Veloso, Anabela; Waldron, Niamh; Witters, Liesbeth; Thean, Aaron Journal: ECS transactions Issue: Volume 66:Number 5(2015) Page Start: 49 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. (Invited) Advanced Transistors for High Frequency Applications. (24th April 2020) Authors: Parvais, Bertrand; Peralagu, Uthayasankaran; Vais, Abhitosh; Alian, AliReza; Witters, Liesbet; Mols, Yves; Walke, Amey; Ingels, Mark; Yu, Hao; Putcha, Vamsi; Khaled, Ahmad; Rodriguez, Raul; Sibaja-Hernandez, Arturo; Yadav, Sachin; ElKashlan, Rana; Baryshnikova, Marina; Mannaert, Geert; Alcotte, R... Journal: ECS transactions Issue: Volume 97:Number 5(2020) Page Start: 27 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. (Invited) Challenges on Surface Conditioning in 3D Device Architectures: Triple-Gate FinFETs, Gate-All-Around Lateral and Vertical Nanowire FETs. (15th August 2017) Authors: Veloso, Anabela; Paraschiv, Vasile; Vecchio, Emma; Devriendt, Katia; Li, Waikin; Simoen, Eddy; Chan, B. T.; Tao, Zheng; Rosseel, Erik; Loo, Roger; Milenin, Alexey P.; Kunert, Bernardette; Teugels, Lieve; Sebaai, Farid; Lorant, Christophe; van Dorp, Dennis; Altamirano-Sánchez, Efraín; Brus, Stepha... Journal: ECS transactions Issue: Volume 80:Number 2(2017) Page Start: 3 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. (Invited) Electrical Activity of Extended Defects in III-V Semiconductors. (3rd July 2019) Authors: Simoen, Eddy Roger; Hsu, P.-C.; Mols, Yves; Kunert, Bernardette; Langer, Robert; Merckling, Clement; Alian, AliReza; Waldron, Niamh; Eneman, Geert; Collaert, Nadine; Heyns, Marc; Claeys, Cor Journal: ECS transactions Issue: Volume 92:Number 4(2019) Page Start: 21 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. (Invited) Epitaxial CVD Growth of Ultra-Thin Si Passivation Layers on Strained Ge Fin Structures. (1st August 2017) Authors: Loo, Roger; Arimura, Hiroaki; Cott, Daire J.; Witters, Liesbeth; Pourtois, Geoffrey; Schulze, Andreas; Douhard, Bastien; Vanherle, Wendy; Eneman, Geert; Richard, Olivier; Favia, Paola; Mitard, Jerome; Mocuta, Dan; Langer, Robert; Collaert, Nadine Journal: ECS transactions Issue: Volume 80:Number 4(2017) Page Start: 241 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. (Invited) Gate-All-Around Nanowire FETs vs. Triple-Gate FinFETs: On Gate Integrity and Device Characteristics. (26th April 2016) Authors: Veloso, Anabela; Cho, Moon Ju; Simoen, Eddy; Hellings, Geert; Matagne, Philippe; Collaert, Nadine; Thean, Aaron Journal: ECS transactions Issue: Volume 72:Number 2(2016) Page Start: 85 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. (Invited) Generation-Recombination Noise in Advanced CMOS Devices. (19th August 2016) Authors: Simoen, Eddy; Oliveira, Alberto Vinícius de; Boudier, Dimitri; Mitard, Jerome; Witters, Liesbeth; Veloso, Anabela; Agopian, Paula Ghedini Der; Martino, Joao Antonio; Carin, Regis; Cretu, Bogdan; Langer, Robert; Collaert, Nadine; Thean, Aaron; Claeys, Cor Journal: ECS transactions Issue: Volume 75:Number 5(2016) Page Start: 111 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. (Invited) Heterogeneous Nano- to Wide-Scale Co-Integration of Beyond-Si and Si CMOS Devices to Enhance Future Electronics. (31st March 2015) Authors: Thean, Aaron; Collaert, Nadine; Radu, Iuliana P.; Waldron, Niamh; Merckling, Clement; Witters, Liesbeth; Loo, Roger; Mitard, Jerome; Rooyackers, Rita; Vandooren, Anne; Verhulst, A.; Veloso, Anabela; Yakimets, D.; Bao, T. Huynh; Chiappe, Danielle; Vaysset, A.; Zografos, O.; Caymax, Matty; Huygheba... Journal: ECS transactions Issue: Volume 66:Number 4(2015) Page Start: 3 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. (Invited) III-V Selective Area Growth and Epitaxial Functional Oxides on Si: From Electronic to Photonic Devices. (26th April 2016) Authors: Merckling, Clement; Liu, Ziyang; Hsu, Mark; Hasan, Samiul; Jiang, Sijia; El Kazzi, Salim; Boccardi, Guillaume; Waldron, Niamh; Wang, Zhechao; Tian, Bin; Pantouvaki, Marianna; Van Campenhout, Joris; Collaert, Nadine; Heyns, Marc; Van Thourhout, Dries; Vandervorst, Wilfried; Thean, Aaron Journal: ECS transactions Issue: Volume 72:Number 2(2016) Page Start: 59 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. (Invited) Impact of the Metal Gate on the Oxide Stack Quality Assessed by Low-Frequency Noise. (1st August 2017) Authors: Simoen, Eddy; He, Liang; O'Sullivan, Barry; Veloso, Anabela; Horiguchi, Naoto; Collaert, Nadine; Claeys, Cor Journal: ECS transactions Issue: Volume 80:Number 4(2017) Page Start: 69 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗