1. Capture and emission time map to investigate the positive VTH shift in p-GaN power HEMTs. (November 2022) Authors: Modolo, N.; Fregolent, M.; Masin, F.; Benato, A.; Bettini, A.; Buffolo, M.; De Santi, C.; Borga, M.; Posthuma, N.; Bakeroot, B.; Decoutere, S.; Vogrig, D.; Neviani, A.; Meneghesso, G.; Zanoni, E.; Meneghini, M. Journal: Microelectronics and reliability Issue: Volume 138(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Comparison between Cu(In, Ga)Se2 solar cells with different back contacts submitted to current stress. (November 2022) Authors: Bertoncello, M.; Barbato, M.; Caria, A.; Buffolo, M.; De Santi, C.; Rampino, S.; Pattini, F.; Spaggiari, G.; Trivellin, N.; Vogrig, D.; Zanoni, E.; Meneghesso, G.; Meneghini, M. Journal: Microelectronics and reliability Issue: Volume 138(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Current induced degradation study on state of the art DUV LEDs. (September 2018) Authors: Trivellin, N.; Monti, D.; De Santi, C.; Buffolo, M.; Meneghesso, G.; Zanoni, E.; Meneghini, M. Journal: Microelectronics and reliability Issue: Volume 88/90(2018) Page Start: 868 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Degradation mechanisms in high power InGaN semiconductor lasers investigated by electrical, optical, spectral and C-DLTS measurements. (November 2020) Authors: Piva, F.; De Santi, C.; Buffolo, M.; Taffarel, M.; Meneghesso, G.; Zanoni, E.; Meneghini, M. Journal: Microelectronics and reliability Issue: Volume 114(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Degradation mechanisms of 1.3 μm C-doped quantum dot lasers grown on native substrate. (November 2021) Authors: Zenari, M.; Buffolo, M.; De Santi, C.; Norman, J.; Herrick, R.W.; Meneghesso, G.; Zanoni, E.; Bowers, J.; Meneghini, M. Journal: Microelectronics and reliability Issue: Volume 126(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser diodes for photonic integrated circuits. (September 2018) Authors: Buffolo, M.; Pietrobon, M.; De Santi, C.; Samparisi, F.; Davenport, M.L.; Bowers, J.E.; Meneghesso, G.; Zanoni, E.; Meneghini, M. Journal: Microelectronics and reliability Issue: Volume 88/90(2018) Page Start: 855 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Effect of indium content and carrier distribution on the efficiency and reliability of InGaN/GaN-based multi quantum well light emitting diode. (November 2021) Authors: Casu, C.; Buffolo, M.; Caria, A.; De Santi, C.; Zanoni, E.; Meneghesso, G.; Meneghini, M. Journal: Microelectronics and reliability Issue: Volume 126(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Experimental observation of TDDB-like behavior in reverse-biased green InGaN LEDs. (September 2016) Authors: Buffolo, M.; Meneghini, M.; De Santi, C.; Felber, H.; Renso, N.; Meneghesso, G.; Zanoni, E. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 610 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Experimental observation of TDDB-like behavior in reverse-biased green InGaN LEDs. (September 2016) Authors: Buffolo, M.; Meneghini, M.; De Santi, C.; Felber, H.; Renso, N.; Meneghesso, G.; Zanoni, E. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 610 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Failure causes and mechanisms of retrofit LED lamps. Issue 9 (August 2015) Authors: De Santi, C.; Dal Lago, M.; Buffolo, M.; Monti, D.; Meneghini, M.; Meneghesso, G.; Zanoni, E. Journal: Microelectronics and reliability Issue: Volume 55:Issue 9/10(2015) Page Start: 1765 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗