Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser diodes for photonic integrated circuits. (September 2018)

• Record Type: Journal Article
• Authors: Buffolo, M.; Pietrobon, M.; De Santi, C.; Samparisi, F.; Davenport, M.L.; Bowers, J.E.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
• Is Part Of: Microelectronics and reliability. Volume 88/90(2018)
• Page Start: 855
• Page End: 858
• Publication Date: 2018-09
• Subjects: Reliability -- Degradation -- Laser-diode -- Silicon-photonics; Electronic apparatus and appliances -- Reliability -- Periodicals; Miniature electronic equipment -- Periodicals; Appareils électroniques -- Fiabilité -- Périodiques; Équipement électronique miniaturisé -- Périodiques; Electronic apparatus and appliances -- Reliability; Miniature electronic equipment; Periodicals; 621.3815
• DOI: 10.1016/j.microrel.2018.06.058
• Languages: English
• ISSNs: 0026-2714

Abstract

Abstract: This paper reports on the degradation processes of heterogeneous III-V/Silicon loop-mirrors laser-diodes designed as the optical sources for next-generation Photonic Integrated Circuits (PICs) operating at 1.55 μm. By submitting the devices to a series of constant-current accelerated aging experiments we were able to identify a common set of degradation mechanisms, including: (i) an increase in threshold current, (ii) a decrease of the sub-threshold emission, (iii) a decrease in the operating voltage of the device and (iv) a small decrease in the slope-efficiency of the laser. The strong correlation between these degradation processes suggests that the loss in optical performance experienced by the devices can be attributed to a decrease in the non-radiative carrier lifetime, as a consequence of the generation/propagation of defects towards the active region of the laser diodes. Highlights: Correlation between optical and electrical degradation Optical degradation is driven by defects diffusion/generation process. The decrease in slope efficiency testifies a decrease in injection efficiency. A trade-off between optical performance and long-term reliability exists.