Current induced degradation study on state of the art DUV LEDs. (September 2018)

• Record Type: Journal Article
• Authors: Trivellin, N.; Monti, D.; De Santi, C.; Buffolo, M.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
• Is Part Of: Microelectronics and reliability. Volume 88/90(2018)
• Page Start: 868
• Page End: 872
• Publication Date: 2018-09
• Subjects: LED -- DUV -- Reliability; Electronic apparatus and appliances -- Reliability -- Periodicals; Miniature electronic equipment -- Periodicals; Appareils électroniques -- Fiabilité -- Périodiques; Équipement électronique miniaturisé -- Périodiques; Electronic apparatus and appliances -- Reliability; Miniature electronic equipment; Periodicals; 621.3815
• DOI: 10.1016/j.microrel.2018.07.145
• Languages: English
• ISSNs: 0026-2714

Abstract

Abstract: We present the first comprehensive study of the degradation of 16 mW state of the art UVC LEDs emitting at 280 nm. The study, based on combined electrical and spectral characterization, allows to identify different degradation regimes and mechanisms, and to formulate hypotheses on their origin. Highlights: Degradation is related to the decrease of the main 280 nm and sideband 354 nm peaks. Different degradation mechanism is reported during the device lifetime. A broad 540 nm peak arises during device degradation. Degradation is possibly related to the increase of QW and EBL defects. QW barriers may play a major role in DUV LED degradation.