21. BS EN IEC 62228-7. Integrated circuits. EMC evaluation of transceivers. Part 7. CXPI transceivers (5th February 2021) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (52 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
22. BS EN IEC 62951-8. Semiconductor devices. Flexible and stretchable semiconductor devices. Part 8. Test method for stretchability, flexibility and stability of flexible resistive memory (21st August 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (16 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
23. BS EN IEC 63215-2. Endurance test methods for die attach materials applied to power electronics devices. Part 2. Temperature cycling test method and reliability performance index for Die attach materials applied to discrete type power electronic devices (29th July 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (23 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
24. BS EN IEC 63215-5. Endurance test methods for die attach materials. Part 5. Temperature cycling test methods for die attach materials (system soldering interconnection) applied to module type power electronic devices (3rd December 2021) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (16 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
25. BS EN IEC 63364-1. Semiconductor devices. Semiconductor devices for IOT system. Part 1. Test method of sound variation detection (18th June 2021) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (14 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
26. BS EN ISO 24448. Fine ceramics (advanced ceramics, advanced technical ceramics). LED light source for testing semiconducting photocatalytic materials used under indoor lighting environment. (7th January 2021) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (23 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
27. BS IEC 62047-42. Semiconductor devices. Micro-electromechanical devices. Part 42. Measurement methods of electromechanical conversion characteristics of piezoelectric MEMS cantilever (9th July 2021) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (22 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
28. BS IEC 63150-2. Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment. Part 2. Human arm swing motion (9th July 2021) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (18 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
29. BS IEC 63275-1 Ed.1.0. Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors. Part 1. Test method for bias temperature instability (1st April 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (11 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
30. BS IEC 63275-2 Ed.1.0. Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors. Part 2. Test method for bipolar degradation by body diode operating (1st April 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (11 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗