41. A comparative radiation analysis of reconfigurable memory technologies: FinFET versus bulk CMOS. (November 2022) Authors: Azimi, S.; De Sio, C.; Portaluri, A.; Rizzieri, D.; Sterpone, L. Journal: Microelectronics and reliability Issue: Volume 138(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
42. A comparative study of lifetime reliability of planar MOSFET and FinFET due to BTI for the 16 nm CMOS technology node based on reaction-diffusion model. (June 2019) Authors: Mounir Mahmoud, Mohamed; Soin, Norhayati Journal: Microelectronics and reliability Issue: Volume 97(2019) Page Start: 53 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
43. A comparative study of nanostructured Silicon-Nitride electrical properties for potential application in RF-MEMS capacitive switches. (September 2019) Authors: Birmpiliotis, D.; Stavrinidis, G.; Koutsoureli, M.; Konstantinidis, G.; Papaioannou, G.; Ziaei, A. Journal: Microelectronics and reliability Issue: Volume 100/101(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
44. A comparative study of thermal fatigue life of Eutectic Sn-Bi, Hybrid Sn-Bi/SAC and SAC solder alloy BGAs. (April 2021) Authors: Cai, Chongyang; Xu, Jiefeng; Wang, Huayan; Park, S.B. Journal: Microelectronics and reliability Issue: Volume 119(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
45. A comparative study on electrothermal characteristics of nanoscale multiple gate MOSFETs. (November 2017) Authors: Gu, Qi-Lin; Zhang, Peng; Ru, Yi; Song, Hao; Zhao, Wen-Sheng; Yin, Wen-Yan Journal: Microelectronics and reliability Issue: Volume 78(2017) Page Start: 362 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
46. A comparison of the effects of cobalt-60 γ ray irradiation on DPSA bipolar transistors at high and low injection levels. (April 2017) Authors: Zhang, Peijian; Wu, Xue; Yi, Qianning; Chen, Wensuo; Yang, Yonghui; Zhu, Kunfeng; Tan, Kaizhou; Zhong, Yi Journal: Microelectronics and reliability Issue: Volume 71(2017) Page Start: 86 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
47. A comparison study on electromagnetic susceptibility of current reference circuits with scaling-down technologies and schemes. (November 2020) Authors: Wang, Zhian; Li, Binhong; Wu, Jianfei; Zhao, Wenxin; Li, Bo; Liu, Hainan; Guan, Chongjie; Feng, Shiwei; Luo, Jiajun; Ye, Tianchun Journal: Microelectronics and reliability Issue: Volume 114(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
48. A composite SystemC-UVM abstract optimal path selection verification architecture for complex designs. (April 2022) Authors: Sharma, Gaurav; Bhargava, Lava; Kumar, V. Journal: Microelectronics and reliability Issue: Volume 131(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
49. A comprehensive evaluation of radiation hardening by applying negative body bias and back-gate bias in 130 nm PDSOI technology. (February 2020) Authors: Xie, Xin; Zhu, Huilong; Bi, Dawei; Hu, Zhiyuan; Ren, JiangChuan; Zhang, Haineng; Zhang, Zhengxuan; Zou, Shichang Journal: Microelectronics and reliability Issue: Volume 105(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
50. A comprehensive framework for cell-aware diagnosis of customer returns. (August 2022) Authors: d'Hondt, P.; Mhamdi, S.; Girard, P.; Virazel, A.; Ladhar, A. Journal: Microelectronics and reliability Issue: Volume 135(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗