1. 3D and circuit integration of MEMS. (2021) Authors: Esashi, Masayoshi, 1949- Editors: Esashi, Masayoshi Record Type: Book Extent: 1 online resource View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A 12–27 GHz SiGe BiCMOS VGA with phase shift variation compensation. (December 2017) Authors: Li, Zhenrong; Liu, Xintong; Zhuang, Yiqi Journal: Microelectronics journal Issue: Volume 70(2017) Page Start: 97 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Access control system for the MAC/packet family: EUROCRYPT. (15th October 1993) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (222 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Ageing of integrated circuits causes, effects and mitigation techniques /: causes, effects and mitigation techniques. (c2020) Other Names: Halak, Basel Record Type: Book Extent: 1 online resource (231 p.) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Analog IC placement generation via neural networks from unlabeled data. (2020) Other Names: Gusmão, António; Horta, Nuno C. G; Lourenço, Nuno; Martins, Ricardo Record Type: Book Extent: 1 online resource (96 p.) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Architecture design for soft errors. (2011) Other Names: Mukherjee, Shubu Record Type: Book Extent: 1 online resource (360 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Atom chips. (2011) Other Names: Reichel, Jakob; Vuletić, Vladan Record Type: Book Extent: 1 online resource (445 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Bits on chips. (2018) Other Names: Veendrick, H. J. M (Harry J. M.) Record Type: Book Extent: 1 online resource View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. BS EN 60749-10. Semiconductor devices. Mechanical and climatic test methods. Part 10. Mechanical shock. Device and subassembly (14th May 2021) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (14 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. BS EN 60749-28. Semiconductor devices. Mechanical and climatic test methods. Part 28. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level (21st November 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (51 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗