BS EN 60749-10. Semiconductor devices. Mechanical and climatic test methods. Part 10. Mechanical shock. Device and subassembly (14th May 2021)

Record Type:
Book
Title:
BS EN 60749-10. Semiconductor devices. Mechanical and climatic test methods. Part 10. Mechanical shock. Device and subassembly (14th May 2021)
Main Title:
BS EN 60749-10. Semiconductor devices. Mechanical and climatic test methods.
Authors:
British Standards Institution,
Publisher Details:
London : British Standards Institution
Publication Date:
2021
Extent:
1 online resource (14 pages)
Subjects:
602.1841
Integrated circuits
Destructive testing
Electronic equipment and components
Mechanical shock
Environmental testing
Climate
Mechanical testing
Impact testing
Semiconductor devices
Languages:
English
ISSNs:
3043-5579
Access Rights:
Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:
Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
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Physical Locations:
British Library HMNTS - ELD.DS.614786
Ingest File:
04_103.xml