BS EN 60749-28. Semiconductor devices. Mechanical and climatic test methods. Part 28. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level (21st November 2020)

Record Type:
Book
Title:
BS EN 60749-28. Semiconductor devices. Mechanical and climatic test methods. Part 28. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level (21st November 2020)
Main Title:
BS EN 60749-28. Semiconductor devices. Mechanical and climatic test methods.
Authors:
British Standards Institution,
Publisher Details:
London : British Standards Institution
Publication Date:
2020
Extent:
1 online resource (51 pages)
Subjects:
602.1841
Electrostatics
Electric charge
Electronic equipment and components
Electric discharges
Mechanical testing
Semiconductor devices
Test methods
Environmental testing
Integrated circuits
Languages:
English
ISSNs:
3041-9235
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Physical Locations:
British Library HMNTS - ELD.DS.578324
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03_219.xml