1. Analysis of bipolar and CMOS amplifiers. (2018) Other Names: Sodagar, Amir M Record Type: Book Extent: 1 online resource (411 pages), (8 illustrations) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Analysis of bipolar and CMOS amplifiers. (©2007) Other Names: Sodagar, Amir M Record Type: Book Extent: 1 online resource (411 pages), illustrations View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Circuits and applications using silicon heterostructure devices. (©2008) Other Names: Cressler, John D Record Type: Book Extent: 1 online resource (1 volume (various pagings)), illustrations View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Detail specification for low power silicon n-p-n switching transistors. 20 V, planar epitaxial, ambient rated, hermetic encapsulation (long lead version). Full plus additional assessment level. (15th July 1978) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (6 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Detail specification for low power silicon n-p-n switching transistors. 65 V, planar epitaxial, ambient rated, hermetic encapsulation (long lead version). Full plus additional assessment level. (15th January 1979) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (6 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Detail specification for low power silicon p-n-p switching transistors. 65 V, planar epitaxial, ambient rated, hermetic encapsulation (long lead version). Full plus additional assessment level. (15th July 1978) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (6 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Detail specification for silicon n-p-n high frequency planar transistor. (15th March 1971) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (12 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Measurement and modeling of silicon heterostructure devices. (2018) Other Names: Cressler, John D Record Type: Book Extent: 1 online resource (200 pages), (9 illustrations) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Measurement and modeling of silicon heterostructure devices. (©2008) Other Names: Cressler, John D Record Type: Book Extent: 1 online resource, illustrations View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Rules for the preparation of detail specifications for semiconductor devices of assessed quality: low noise, low power microwave transistors. (31st December 1989) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (12 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗