71. Reference conditions and procedures for testing industrial and process measurement transmitters. Specific procedures for flow transmitters Part 5, (28th October 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (40 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
72. Reference conditions and procedures for testing industrial and process measurement transmitters. Specific procedures for level transmitters Part 4, (26th October 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (64 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
73. Reference conditions and procedures for testing industrial and process measurement transmitters. Specific procedures for pressure transmitters Part 2, (5th November 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (30 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
74. Reliability of devices used in fibre optic systems. General and guidance. (10th January 2012) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (20 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
75. Rubber, vulcanized or thermoplastic. Determination of ageing characteristics by measurement of stress relaxation in tension. (22nd April 2021) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (18 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
76. Semiconductor devices. Generic specification for discrete devices and integrated circuits Part 10, (31st July 2011) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (38 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
77. Semiconductor devices. Mechanical and climatic test methods. Board level drop test method using a strain gauge Part 40, (30th September 2011) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (26 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
78. Semiconductor devices. Mechanical and climatic test methods. Damp heat, steady state, highly accelerated stress test (HAST) Part 4, (28th November 2017) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (16 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
79. Semiconductor devices. Mechanical and climatic test methods. Salt atmosphere Part 13, (30th April 2018) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (20 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
80. Semiconductor devices. Mechanical and climatic test methods. Standard reliability testing methods of non-volatile memory devices Part 41, (9th September 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (26 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗