Semiconductor devices. Mechanical and climatic test methods. Damp heat, steady state, highly accelerated stress test (HAST) Part 4, (28th November 2017)

Record Type:
Book
Title:
Semiconductor devices. Mechanical and climatic test methods. Damp heat, steady state, highly accelerated stress test (HAST) Part 4, (28th November 2017)
Main Title:
Semiconductor devices. Mechanical and climatic test methods.
Authors:
British Standards Institution,
Issue Display:
Part 4
Part:
4
Issue Sort Value:
0000-0000-0000-0004
Publisher Details:
London : British Standards Institution
Publication Date:
2017
Extent:
1 online resource (16 pages)
Subjects:
602.1841
Environmental testing
Semiconductor devices
Integrated circuits
Electronic equipment and components
Climate
Accelerated testing
Mechanical testing
Damp-heat tests
Languages:
English
Related ISBNs:
9780580942297
ISSNs:
3034-1342
Access Rights:
Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:
Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:
British Library HMNTS - ELD.DS.744495
Ingest File:
15_030.xml