Semiconductor devices. Mechanical and climatic test methods. Board level drop test method using a strain gauge Part 40, (30th September 2011)

Record Type:
Book
Title:
Semiconductor devices. Mechanical and climatic test methods. Board level drop test method using a strain gauge Part 40, (30th September 2011)
Main Title:
Semiconductor devices. Mechanical and climatic test methods.
Authors:
British Standards Institution,
Issue Display:
Part 40
Part:
40
Issue Sort Value:
0000-0000-0000-0040
Publisher Details:
London : British Standards Institution
Publication Date:
2011
Extent:
1 online resource (26 pages)
Subjects:
602.1841
Integrated circuits
Drop tests
Mechanical testing
Semiconductor devices
Electronic equipment and components
Impact testing
Strain measurement
Surface mounting devices
Accelerated testing
Environmental testing
Printed-circuit boards
Languages:
English
Related ISBNs:
9780580646294
ISSNs:
3019-0357
Access Rights:
Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:
Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:
British Library HMNTS - ELD.DS.746713
Ingest File:
16_008.xml