Semiconductor devices. Mechanical and climatic test methods. Salt atmosphere Part 13, (30th April 2018)

Record Type:: Book
Title:: Semiconductor devices. Mechanical and climatic test methods. Salt atmosphere Part 13, (30th April 2018)
Main Title:: Semiconductor devices. Mechanical and climatic test methods.
Authors:: British Standards Institution,
Issue Display:: Part 13
Part:: 13
Issue Sort Value:: 0000-0000-0000-0013
Publisher Details:: London : British Standards Institution
Publication Date:: 2018
Extent:: 1 online resource (20 pages)
Subjects:: 602.1841
Destructive testing
Environmental testing
Salt-spray tests
Electronic equipment and components
Mechanical testing
Accelerated corrosion tests
Climate
Integrated circuits
Accelerated testing
Salts
Corrosion resistance
Semiconductor devices
Languages:: English
Related ISBNs:: 9780580984228
ISSNs:: 3036-0035
Access Rights:: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library HMNTS - ELD.DS.746629
Ingest File:: 16_008.xml