Semiconductor devices. Mechanical and climatic test methods. Standard reliability testing methods of non-volatile memory devices Part 41, (9th September 2020)

• Record Type: Book
• Authors: British Standards Institution,
• Publisher Details: London : British Standards Institution
• Publication Date: 2020
• Extent: 1 online resource (26 pages)
• Subjects: 602.1841; Flammability; Moisture measurement; Defects; Solderability testing; Storage; Testing conditions; Visual inspection (testing); Marking; Stress; Fire tests; Test equipment; Vibration testing; Temperature measurement; Specimen preparation; Semiconductor devices; Accelerated testing; Bonding; Electric terminals; Electrical testing; Endurance testing; Test specimens; Thermal-shock tests; Environmental testing; Strength of materials; Mass spectrometry; Classification systems; Integrated circuits; Damp-heat tests; Shear testing; Low-pressure tests; Thermal testing; Mechanical testing; Leak tests; Radioactive tracer methods; Electronic equipment and components; Pull-out tests; Dimensional measurement; Torsion testing
• Languages: English
• Related ISBNs: 9780580962875
• ISSNs: 3035-0993
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.