ISSN: 0026-2714 - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

ISSN 0026-2714

21. [131] Experimental study of the short-circuit robustness of 600 V E-mode GaN transistors. (September 2016)

Authors:: Landel, M.; Gautier, C.; Labrousse, D.; Lefebvre, S.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 560
Record Type:: Journal Article
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22. `Failure analysis of short-circuit failure of metal-oxide-metal capacitor. (October 2022)

Authors:: Wang, Yan; Zhu, Qingguo; Huang, Caiqing
Journal:: Microelectronics and reliability
Issue:: Volume 137(2022)
Page Start:
Record Type:: Journal Article
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23. A 2-D analytical threshold-voltage model for GeOI/GeON MOSFET with high-k gate dielectric. (February 2016)

Authors:: Ji, Feng; Xu, J.P.; Liu, L.; Tang, W.M.; Lai, P.T.
Journal:: Microelectronics and reliability
Issue:: Volume 57(2016)
Page Start:: 24
Record Type:: Journal Article
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24. A 28 nm full-margin, high-reliability, and ultra-low-power consumption sense amplifier for STT-MRAM. (September 2019)

Authors:: Zheng, S.W.; Bi, J.S.; Xi, K.; Liu, J.; Liu, M.; Luo, L.
Journal:: Microelectronics and reliability
Issue:: Volume 100/101(2019)
Page Start:
Record Type:: Journal Article
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25. A 2D compact model for lightly doped DG MOSFETs (P-DGFETs) including negative bias temperature instability (NBTI) and short channel effects (SCEs). (December 2016)

Authors:: Samy, Omnia; Abdelhamid, Hamdy; Ismail, Yehea; Zekry, Abdelhalim
Journal:: Microelectronics and reliability
Issue:: Volume 67(2016)
Page Start:: 82
Record Type:: Journal Article
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26. A 3-D thermal network model for the temperature monitoring of thermal grease as interface material. (November 2020)

Authors:: Zhang, Xiaotong; Wang, Shihang; Xin, Lei; Wu, Kangning; Yu, Xiaoling; Wang, Xiaolin; Li, Jianying
Journal:: Microelectronics and reliability
Issue:: Volume 114(2020)
Page Start:
Record Type:: Journal Article
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27. A 3D numerical study of humidity evolution and condensation risk on a printed circuit board (PCB) exposed to harsh ambient conditions. (April 2018)

Authors:: Shojaee Nasirabadi, Parizad; Hattel, Jesper Henri
Journal:: Microelectronics and reliability
Issue:: Volume 83(2018)
Page Start:: 39
Record Type:: Journal Article
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28. A BICS-based strategy for mitigating the effects of single event transients on SAR converter. (February 2019)

Authors:: Gao, Jing; Ding, Yingguang; Nie, Kaiming; Xu, Jiangtao
Journal:: Microelectronics and reliability
Issue:: Volume 93(2019)
Page Start:: 45
Record Type:: Journal Article
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29. A body built-in cell for detecting transient faults and dynamically biasing subcircuits of integrated systems. (September 2018)

Authors:: Ferreira de Paiva Leite, Thiago; Fesquet, Laurent; Possamai Bastos, Rodrigo
Journal:: Microelectronics and reliability
Issue:: Volume 88/90(2018)
Page Start:: 122
Record Type:: Journal Article
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30. A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability. (February 2018)

Authors:: Kaczer, B.; Franco, J.; Weckx, P.; Roussel, Ph.J.; Putcha, V.; Bury, E.; Simicic, M.; Chasin, A.; Linten, D.; Parvais, B.; Catthoor, F.; Rzepa, G.; Waltl, M.; Grasser, T.
Journal:: Microelectronics and reliability
Issue:: Volume 81(2018)
Page Start:: 186
Record Type:: Journal Article
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