A body built-in cell for detecting transient faults and dynamically biasing subcircuits of integrated systems. (September 2018)

• Record Type: Journal Article
• Authors: Ferreira de Paiva Leite, Thiago; Fesquet, Laurent; Possamai Bastos, Rodrigo
• Is Part Of: Microelectronics and reliability. Volume 88/90(2018)
• Page Start: 122
• Page End: 127
• Publication Date: 2018-09
• Subjects: Body biasing -- Transient fault detection -- Level-shifter -- BBICS; Electronic apparatus and appliances -- Reliability -- Periodicals; Miniature electronic equipment -- Periodicals; Appareils électroniques -- Fiabilité -- Périodiques; Équipement électronique miniaturisé -- Périodiques; Electronic apparatus and appliances -- Reliability; Miniature electronic equipment; Periodicals; 621.3815
• DOI: 10.1016/j.microrel.2018.07.069
• Languages: English
• ISSNs: 0026-2714

Abstract

Abstract: Power consumption and reliability are nowadays the main concerns for nanoelectronic systems. In fact, these factors are closely related, the reliable operation of a system is strongly associated with its power supply voltage ( V dd ), frequency of operation, and body biasing. Therefore, power management and fault tolerance techniques need to be jointly implemented to guarantee better overall low-consuming and reliable solutions. This paper presents a novel body built-in cell to address these two issues. It is capable of: 1) detecting short-duration and long-duration transient faults (TF), thus enhancing system's reliability; 2) controlling the circuit's threshold voltage ( V th ) through the implementation of adaptive body biasing (ABB) schemes, thus optimizing the system's trade-off between low-power and high performance. Highlights: Novel body built-in cell for body biasing and transient fault (TF) detection Detecting short-duration and long-duration TFs under temperature and process variation Efficiently implementing adaptive body biasing (ABB) schemes with a wide biasing range