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- 621.38152 22
- Semiconducteurs -- Périodiques 22
- Semiconductors -- Periodicals 22
- 4H-SiC -- MOS capacitor -- Near-interface traps -- Quantum confinement -- Gate oxide 1
- Border traps -- Gate oxide defects -- Interface defects -- III-V -- MOSFET -- RF -- Small-signal model 1
- Electrical stress -- Thin-film transistors -- Zinc nitride -- Spin-on glass 1
- Electrostatic discharge (ESD) protection -- Gate-grounded NMOS (GGNMOS) -- PNP-trigger -- Dynamic substrate 1
- GAA NW FETs -- Low frequency noise -- Flicker noise -- Cryogenic temperature -- Mobility fluctuations -- Carrier number fluctuations 1
- Junctionless (JL) FinFET -- InGaAs FinFET -- Quantum capacitance -- Random Dopant Fluctuation (RDF) -- Threshold voltage variability 1
- MIM diode -- Laser beam lithography -- CPW -- Zero bias -- Rectification 1