Is Part Of: Microelectronics and reliability. Volume 93(2019) - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Is Part Of Microelectronics and reliability. Volume 93(2019)

1. A BICS-based strategy for mitigating the effects of single event transients on SAR converter. (February 2019)

Authors:: Gao, Jing; Ding, Yingguang; Nie, Kaiming; Xu, Jiangtao
Journal:: Microelectronics and reliability
Issue:: Volume 93(2019)
Page Start:: 45
Record Type:: Journal Article
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2. A cost-efficient error-resilient approach to distributed arithmetic for signal processing. (February 2019)

Authors:: Lu, Yue; Duan, Shengyu; Halak, Basel; J Kazmierski, Tom
Journal:: Microelectronics and reliability
Issue:: Volume 93(2019)
Page Start:: 16
Record Type:: Journal Article
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3. A hybrid coding retransmitted chipless tag loaded by microstrip resonator. (February 2019)

Authors:: Ma, Zhonghua; Chen, Chih-Cheng
Journal:: Microelectronics and reliability
Issue:: Volume 93(2019)
Page Start:: 1
Record Type:: Journal Article
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4. A voltage-transient method for characterizing traps in GaN HEMTs. (February 2019)

Authors:: Zheng, Xiang; Feng, Shiwei; Gao, Yifu; Zhang, Yamin; Jia, Yunpeng; Pan, Shijie
Journal:: Microelectronics and reliability
Issue:: Volume 93(2019)
Page Start:: 57
Record Type:: Journal Article
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5. An Android mutation malware detection based on deep learning using visualization of importance from codes. (February 2019)

Authors:: Yen, Yao-Saint; Sun, Hung-Min
Journal:: Microelectronics and reliability
Issue:: Volume 93(2019)
Page Start:: 109
Record Type:: Journal Article
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6. Characteristics and reliability of VDMOS under capacitive loads. (February 2019)

Authors:: Zhang, Yulong; Wang, Lulu; Gong, Xueqin; Gao, Bo; Wang, Lixin; Luo, Jiajun
Journal:: Microelectronics and reliability
Issue:: Volume 93(2019)
Page Start:: 8
Record Type:: Journal Article
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7. Circuit analysis to predict humidity related failures in electronics - Methodology and recommendations. (February 2019)

Authors:: Joshy, Salil; Verdingovas, Vadimas; Jellesen, Morten Stendahl; Ambat, Rajan
Journal:: Microelectronics and reliability
Issue:: Volume 93(2019)
Page Start:: 81
Record Type:: Journal Article
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8. Cycle life and statistical predictive reliability model for all-solid-state thin film microbatteries. (February 2019)

Authors:: Grillon, Nathanaël; Bouyssou, Émilien; Jacques, Sébastien; Gautier, Gaël
Journal:: Microelectronics and reliability
Issue:: Volume 93(2019)
Page Start:: 102
Record Type:: Journal Article
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9. Determination of DC equivalent hot carrier stress times in scaled CMOS devices using novel AC stress methodology. (February 2019)

Authors:: Kerber, Andreas; Nigam, Tanya
Journal:: Microelectronics and reliability
Issue:: Volume 93(2019)
Page Start:: 98
Record Type:: Journal Article
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10. Editorial Board. (February 2019)

Journal:: Microelectronics and reliability
Issue:: Volume 93(2019)
Page Start:: ii
Record Type:: Journal Article
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