1. A deep learning-based recognition method for degradation monitoring of ball screw with multi-sensor data fusion. (August 2017) Authors: Zhang, Li; Gao, Hongli; Wen, Juan; Li, Shichao; Liu, Qi Journal: Microelectronics and reliability Issue: Volume 75(2017) Page Start: 215 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A fault detection strategy using the enhancement ensemble empirical mode decomposition and random decrement technique. (August 2017) Authors: Xiang, Jiawei; Zhong, Yongteng Journal: Microelectronics and reliability Issue: Volume 75(2017) Page Start: 317 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. A high fault coverage test approach for communication channels in network on chip. (August 2017) Authors: Aghaei, Babak Journal: Microelectronics and reliability Issue: Volume 75(2017) Page Start: 178 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. A review of lead-free solders for electronics applications. (August 2017) Authors: Cheng, Shunfeng; Huang, Chien-Ming; Pecht, Michael Journal: Microelectronics and reliability Issue: Volume 75(2017) Page Start: 77 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. An FPGA-based dynamically reconfigurable platform for emulation of permanent faults in ASICs. (August 2017) Authors: Ullah, A.; Sanchez, E.; Sterpone, L.; Cardona, L.A.; Ferrer, C. Journal: Microelectronics and reliability Issue: Volume 75(2017) Page Start: 110 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. An optimal evaluating method for uncertainty metrics in reliability based on uncertain data envelopment analysis. (August 2017) Authors: Zu, Tianpei; Wen, Meilin; Kang, Rui Journal: Microelectronics and reliability Issue: Volume 75(2017) Page Start: 283 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Analytical long-term NBTI recovery model with slowing diffusivity and locking effect of hydrogen considered. (August 2017) Authors: Zeng, Yan; Li, XiaoJin; Wang, Yanling; Sun, Yabin; Shi, YanLing; Guo, Ao; Hu, ShaoJian; Chen, Shoumian; Zhao, Yuhang Journal: Microelectronics and reliability Issue: Volume 75(2017) Page Start: 20 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Characterization of MIS structures and thin film transistors using RF-sputtered HfO2/HIZO layers. (August 2017) Authors: Hernandez, I.; Pons-Flores, C.A.; Garduño, I.; Tinoco, J.; Mejia, I.; Estrada, M. Journal: Microelectronics and reliability Issue: Volume 75(2017) Page Start: 9 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Condition multi-classification and evaluation of system degradation process using an improved support vector machine. (August 2017) Authors: Miao, Qiang; Zhang, Xin; Liu, Zhiwen; Zhang, Heng Journal: Microelectronics and reliability Issue: Volume 75(2017) Page Start: 223 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Coupling damage and reliability modeling for creep and fatigue of solder joint. (August 2017) Authors: Chen, Yunxia; Jin, Yi; Kang, Rui Journal: Microelectronics and reliability Issue: Volume 75(2017) Page Start: 233 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗