Is Part Of: Microelectronics and reliability. Volume 75(2017) - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Is Part Of Microelectronics and reliability. Volume 75(2017)

1. A deep learning-based recognition method for degradation monitoring of ball screw with multi-sensor data fusion. (August 2017)

Authors:: Zhang, Li; Gao, Hongli; Wen, Juan; Li, Shichao; Liu, Qi
Journal:: Microelectronics and reliability
Issue:: Volume 75(2017)
Page Start:: 215
Record Type:: Journal Article
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2. A fault detection strategy using the enhancement ensemble empirical mode decomposition and random decrement technique. (August 2017)

Authors:: Xiang, Jiawei; Zhong, Yongteng
Journal:: Microelectronics and reliability
Issue:: Volume 75(2017)
Page Start:: 317
Record Type:: Journal Article
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3. A high fault coverage test approach for communication channels in network on chip. (August 2017)

Authors:: Aghaei, Babak
Journal:: Microelectronics and reliability
Issue:: Volume 75(2017)
Page Start:: 178
Record Type:: Journal Article
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4. A review of lead-free solders for electronics applications. (August 2017)

Authors:: Cheng, Shunfeng; Huang, Chien-Ming; Pecht, Michael
Journal:: Microelectronics and reliability
Issue:: Volume 75(2017)
Page Start:: 77
Record Type:: Journal Article
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5. An FPGA-based dynamically reconfigurable platform for emulation of permanent faults in ASICs. (August 2017)

Authors:: Ullah, A.; Sanchez, E.; Sterpone, L.; Cardona, L.A.; Ferrer, C.
Journal:: Microelectronics and reliability
Issue:: Volume 75(2017)
Page Start:: 110
Record Type:: Journal Article
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6. An optimal evaluating method for uncertainty metrics in reliability based on uncertain data envelopment analysis. (August 2017)

Authors:: Zu, Tianpei; Wen, Meilin; Kang, Rui
Journal:: Microelectronics and reliability
Issue:: Volume 75(2017)
Page Start:: 283
Record Type:: Journal Article
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7. Analytical long-term NBTI recovery model with slowing diffusivity and locking effect of hydrogen considered. (August 2017)

Authors:: Zeng, Yan; Li, XiaoJin; Wang, Yanling; Sun, Yabin; Shi, YanLing; Guo, Ao; Hu, ShaoJian; Chen, Shoumian; Zhao, Yuhang
Journal:: Microelectronics and reliability
Issue:: Volume 75(2017)
Page Start:: 20
Record Type:: Journal Article
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8. Characterization of MIS structures and thin film transistors using RF-sputtered HfO2/HIZO layers. (August 2017)

Authors:: Hernandez, I.; Pons-Flores, C.A.; Garduño, I.; Tinoco, J.; Mejia, I.; Estrada, M.
Journal:: Microelectronics and reliability
Issue:: Volume 75(2017)
Page Start:: 9
Record Type:: Journal Article
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9. Condition multi-classification and evaluation of system degradation process using an improved support vector machine. (August 2017)

Authors:: Miao, Qiang; Zhang, Xin; Liu, Zhiwen; Zhang, Heng
Journal:: Microelectronics and reliability
Issue:: Volume 75(2017)
Page Start:: 223
Record Type:: Journal Article
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10. Coupling damage and reliability modeling for creep and fatigue of solder joint. (August 2017)

Authors:: Chen, Yunxia; Jin, Yi; Kang, Rui
Journal:: Microelectronics and reliability
Issue:: Volume 75(2017)
Page Start:: 233
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗