Is Part Of: Microelectronics and reliability. Volume 133(2022) - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Is Part Of Microelectronics and reliability. Volume 133(2022)

1. A highly reliable radiation tolerant 13T SRAM cell for deep space applications. (June 2022)

Authors:: Yekula, Ravi Teja; Pandey, Monalisa; Islam, Aminul
Journal:: Microelectronics and reliability
Issue:: Volume 133(2022)
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Record Type:: Journal Article
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2. A Π-shaped p-GaN HEMT for reliable enhancement mode operation. (June 2022)

Authors:: Sehra, Khushwant; Kumari, Vandana; Gupta, Mridula; Mishra, Meena; Rawal, D.S.; Saxena, Manoj
Journal:: Microelectronics and reliability
Issue:: Volume 133(2022)
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3. Degradation of 650 V SiC double-trench MOSFETs under repetitive overcurrent switching stress. (June 2022)

Authors:: Wang, Lihao; Jia, Yunpeng; Zhou, Xintian; Zhao, Yuanfu; Hu, Dongqing; Wu, Yu; Wang, Liang; Li, Tongde; Deng, Zhonghan
Journal:: Microelectronics and reliability
Issue:: Volume 133(2022)
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4. Determining adhesion of critical interfaces in microelectronics – A reverse Finite Element Modelling approach based on nanoindentation. (June 2022)

Authors:: Reuther, G.M.; Albrecht, J.; Dudek, R.; Rzepka, S.
Journal:: Microelectronics and reliability
Issue:: Volume 133(2022)
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5. Double-node-upset aware SRAM bit-cell for aerospace applications. (June 2022)

Authors:: Prasad, Govind; Mandi, Bipin Chandra; Ali, Maifuz
Journal:: Microelectronics and reliability
Issue:: Volume 133(2022)
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6. Editorial Board. (June 2022)

Journal:: Microelectronics and reliability
Issue:: Volume 133(2022)
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7. Electroplated Ni-P film for power devices without cracks induced by high temperature heating. (June 2022)

Authors:: Fujimori, Yuji; Shimizu, Masahiro; Kurashina, Tadashi; Arai, Susumu
Journal:: Microelectronics and reliability
Issue:: Volume 133(2022)
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8. Ionizing radiation response of bismuth titanate-based metal-ferroelectric-semiconductor (MFS) type capacitor. (June 2022)

Authors:: Kaymaz, Ahmet
Journal:: Microelectronics and reliability
Issue:: Volume 133(2022)
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9. Towards electro-thermo-mechanical lifetime assessment for arbitrary power electronics. (June 2022)

Authors:: Gschwandl, Mario; Friedrich, Birgit; Pfost, Martin; Antretter, Thomas; Fuchs, Peter Filipp; Mitev, Ivaylo; Tao, Qi; Schingale, Angelika
Journal:: Microelectronics and reliability
Issue:: Volume 133(2022)
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10. Vulnerability evaluation on 16 nm FinFET Ultrascale+ MPSoC using fault injection and proton irradiation. (June 2022)

Authors:: Li, Yonghong; Yang, Weitao; Wang, Maocheng; Li, Yang; Guo, Yaxin; Li, Pei; Zhao, Haoyu; He, Chaohui; Wang, Di; Yang, Ye; Zhang, Xiaodong; An, Heng
Journal:: Microelectronics and reliability
Issue:: Volume 133(2022)
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Record Type:: Journal Article
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