21. Characterization of Leakage Causing Visible Epitaxial Defects Nucleating from Crystal Defects in the Substrate. (23rd August 2016) Authors: Das, Hrishikesh; Sunkari, Swapna; Naas, Hans Journal: ECS transactions Issue: Volume 75:Number 12(2016) Page Start: 233 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
22. Deep Trap Levels Responsible for Current Collapse in AlGaN/GaN MISHFET. (23rd August 2016) Authors: Seol, Jeong-hoon; Kang, Hee-Sung; Lee, Gil-Ho; Lee, Jung-Hee; Hahm, Sung-Ho Journal: ECS transactions Issue: Volume 75:Number 12(2016) Page Start: 131 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
23. Direct Observation of Energy Distribution of Interface States at SiO2/4H-SiC Interface. (23rd August 2016) Authors: Yamashita, Yoshiyuki; Hasunuma, Ryu; Nagata, Takahiro; Chikyow, Toyohiro Journal: ECS transactions Issue: Volume 75:Number 12(2016) Page Start: 207 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
24. Interfacial Transitional Layer in SiO2 Film Thermally Grown on SiC(000-1). (23rd August 2016) Authors: Nagai, Ryu; Iitsuka, Nozomu; Ozawa, Kodai; Hasunuma, Ryu; Yamabe, Kikuo Journal: ECS transactions Issue: Volume 75:Number 12(2016) Page Start: 123 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
25. Investigation of Penetration Depth and Defect Image Contrast Formation in Grazing Incidence X-ray Topography of 4H-SiC Wafers. (23rd August 2016) Authors: Yang, Yu; Guo, Jianqiu; Goue, Ouloide Yannick; Raghothamachar, Balaji; Dudley, Michael; Chung, G; Sanchez, E; Maning, I Journal: ECS transactions Issue: Volume 75:Number 12(2016) Page Start: 239 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
26. Non-Pressure Joining Method for Zn-Al Solder by Pre-Ultrasonic Bonding. (23rd August 2016) Authors: Tanisawa, Hidekazu; Takahashi, Hiroki; Kato, Fumiki; Koui, Kenichi; Sato, Shinji; Murakami, Yoshinori; Sato, Hiroshi Journal: ECS transactions Issue: Volume 75:Number 12(2016) Page Start: 117 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
27. The Novel Way to Inspection Technique for SiC Substrate by Applying Stress Effects. (23rd August 2016) Authors: Sakata, Yoshitaro; Terasaki, Nao; Nonaka, Kazuhiro Journal: ECS transactions Issue: Volume 75:Number 12(2016) Page Start: 139 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
28. Ultra Large Scale Manufacturing Challenges of Silicon Carbide and Gallium Nitride Based Power Devices and Systems. (23rd August 2016) Authors: Singh, Rajendra; Asif, Amir A Journal: ECS transactions Issue: Volume 75:Number 12(2016) Page Start: 11 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗