1. (Invited) Advanced Semiconductor Devices for Future CMOS Technologies. (27th March 2015) Authors: Claeys, Cor; Chiappe, Danielle; Collaert, Nadine; Mitard, Jerome; Radu, Juliana; Rooyackers, Rita; Simoen, Eddy; Vandooren, Anne; Veloso, Anabela; Waldron, Niamh; Witters, Liesbeth; Thean, Aaron Journal: ECS transactions Issue: Volume 66:Number 5(2015) Page Start: 49 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. (Invited) Epitaxial CVD Growth of Ultra-Thin Si Passivation Layers on Strained Ge Fin Structures. (1st August 2017) Authors: Loo, Roger; Arimura, Hiroaki; Cott, Daire J.; Witters, Liesbeth; Pourtois, Geoffrey; Schulze, Andreas; Douhard, Bastien; Vanherle, Wendy; Eneman, Geert; Richard, Olivier; Favia, Paola; Mitard, Jerome; Mocuta, Dan; Langer, Robert; Collaert, Nadine Journal: ECS transactions Issue: Volume 80:Number 4(2017) Page Start: 241 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. (Invited) Generation-Recombination Noise in Advanced CMOS Devices. (19th August 2016) Authors: Simoen, Eddy; Oliveira, Alberto Vinícius de; Boudier, Dimitri; Mitard, Jerome; Witters, Liesbeth; Veloso, Anabela; Agopian, Paula Ghedini Der; Martino, Joao Antonio; Carin, Regis; Cretu, Bogdan; Langer, Robert; Collaert, Nadine; Thean, Aaron; Claeys, Cor Journal: ECS transactions Issue: Volume 75:Number 5(2016) Page Start: 111 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. (Invited) Heterogeneous Nano- to Wide-Scale Co-Integration of Beyond-Si and Si CMOS Devices to Enhance Future Electronics. (31st March 2015) Authors: Thean, Aaron; Collaert, Nadine; Radu, Iuliana P.; Waldron, Niamh; Merckling, Clement; Witters, Liesbeth; Loo, Roger; Mitard, Jerome; Rooyackers, Rita; Vandooren, Anne; Verhulst, A.; Veloso, Anabela; Yakimets, D.; Bao, T. Huynh; Chiappe, Danielle; Vaysset, A.; Zografos, O.; Caymax, Matty; Huygheba... Journal: ECS transactions Issue: Volume 66:Number 4(2015) Page Start: 3 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. (Invited) Processing Technologies for Advanced Ge Devices. (18th August 2016) Authors: Loo, Roger; Hikavyy, Andriy Yakovitch; Witters, Liesbeth; Schulze, Andreas; Arimura, Hiroaki; Cott, Daire; Mitard, Jerome; Porret, Clement; Mertens, Hans; Ryan, Paul; Wall, John; Matney, Kevin; Wormington, Matthew; Favia, Paola; Richard, Olivier; Bender, Hugo; Horiguchi, Naoto; Collaert, Nadine; ... Journal: ECS transactions Issue: Volume 75:Number 8(2016) Page Start: 491 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. (Invited) Raman Stress Measurements at the Nanoscale. (20th July 2018) Authors: Nuytten, Thomas; Bogdanowicz, Janusz; Aslam, I.; Witters, Liesbeth; Eneman, Geert; Hantschel, Thomas; Schulze, Andreas; Favia, Paola; Bender, Hugo; De Wolf, Ingrid; Vandervorst, Wilfried; van der Heide, Paul Journal: ECS transactions Issue: Volume 86:Number 7(2018) Page Start: 311 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. (Invited) Selective Etch of Si and SiGe for Gate All-Around Device Architecture. (11th September 2015) Authors: Wostyn, Kurt; Sebaai, Farid; Rip, Jens; Mertens, Hans; Witters, Liesbeth; Loo, Roger; Hikavyy, Andriy Yakovitch; Milenin, Alexey; Horiguchi, Naoto; Collaert, Nadine; Thean, Aaron; Mertens, Paul W.; De Gendt, Stefan; Holsteyns, Frank Journal: ECS transactions Issue: Volume 69:Number 8(2015) Page Start: 147 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. (Plenary) The Revival of Compound Semiconductors and How They Will Change the World in a 5G/6G Era. (8th September 2020) Authors: Collaert, Nadine; Alian, AliReza; Banerjee, Aritra; Chauhan, Vikas; ElKashlan, Rana Y.; Hsu, Brent; Ingels, Mark; Khaled, Ahmad; Kodandarama, Komal Vondkar; Kunert, Bernardette; Mols, Yves; Peralagu, Uthayasankaran; Putcha, Vamsi; Rodriguez, Raul; Sibaja-Hernandez, Arturo; Simoen, Eddy; Vais, Abh... Journal: ECS transactions Issue: Volume 98:Number 5(2020) Page Start: 15 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Low temperature epitaxial growth of Ge:B and Ge0.99Sn0.01:B source/drain for Ge pMOS devices: in-situ and conformal B-doping, selectivity towards oxide and nitride with no need for any post-epi activation treatment. (22nd February 2019) Authors: Vohra, Anurag; Porret, Clement; Kohen, David; Folkersma, Steven; Bogdanowicz, Janusz; Schaekers, Marc; Tolle, John; Hikavyy, Andriy; Capogreco, Elena; Witters, Liesbeth; Langer, Robert; Vandervorst, Wilfried; Loo, Roger Journal: Japanese journal of applied physics Issue: Volume 58:Number SB(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Simulation of Cu pad expansion in wafer-to-wafer Cu/SiCN hybrid bonding. (November 2022) Authors: Tsau, Yan Wen; De Messemaeker, Joke; Salahouelhadj, Abdellah; Gonzalez, Mario; Witters, Liesbeth; Zhang, Boyao; Seefeldt, Marc; Beyne, Eric; De Wolf, Ingrid Journal: Microelectronics and reliability Issue: Volume 138(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗