1. 0.67‐μm2 /bitcell two‐transistor leakage‐based physically unclonable function with native bit‐instability of 0.89% at 65 nm. Issue 23 (9th October 2020) Authors: Li, Gang; Wang, Pengjun; Ma, Xuejiao; Chen, Bo Journal: Electronics letters Issue: Volume 56:Issue 23(2020) Page Start: 1237 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A 65nm/0.448 mW EEG processor with parallel architecture SVM and lifting wavelet transform for high-performance and low-power epilepsy detection. (May 2022) Authors: Wen, Yongzhong; Zhang, Yuejun; Wen, Liang; Cao, Haojie; Ai, Guangpeng; Gu, Minghong; Wang, Pengjun; Chen, Huiling Journal: Computers in biology and medicine Issue: Volume 144(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. A challenge-screening strategy for enhancing the stability of strong PUF based on machine learning. (January 2023) Authors: Zhou, Ziyu; Li, Gang; Wang, Pengjun Journal: Microelectronics journal Issue: Volume 131(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. A configurable detection chip with ±0.6% Inaccuracy for liquid conductivity using dual-frequency sinusoidal signal technique in 65 nm CMOS. (June 2022) Authors: Lin, Ye; Zhang, Yuejun; Fu, Shengjie; Zhang, Huihong; Wang, Pengjun Journal: Microelectronics journal Issue: Volume 124(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. A greedy algorithm based Compensation Circuit for Optimizing the Output Statistics of APUF. (January 2023) Authors: Lian, Jiana; Wang, Pengjun; Li, Gang Journal: Microelectronics journal Issue: Volume 131(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. A lightweight convolutional neural network hardware implementation for wearable heart rate anomaly detection. (March 2023) Authors: Gu, Minghong; Zhang, Yuejun; Wen, Yongzhong; Ai, Guangpeng; Zhang, Huihong; Wang, Pengjun; Wang, Guoqing Journal: Computers in biology and medicine Issue: Volume 155(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. A low standby-power fast carbon nanotube ternary SRAM cell with improved stability *Project supported by the National Natural Science Foundation of China (Nos. 61474068, 61234002, 61404076), the S&T Plan of Zhejiang Provincial Science and Technology Department (No. 2016C31078), and the K.C. Wong Magna Fund in Ningbo University, China. (August 2018) Authors: Li, Gang; Wang, Pengjun; Kang, Yaopeng; Zhang, Yuejun Journal: Journal of semiconductors Issue: Volume 39:Number 8(2018:Aug.) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. A multi-port low-power current mode PUF using MOSFET current-division deviation in 65 nm technology. (September 2017) Authors: Li, Gang; Wang, Pengjun; Zhang, Yuejun; Zhang, Huihong Journal: Microelectronics journal Issue: Volume 67(2017) Page Start: 169 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. A PUFs-based hardware authentication BLAKE algorithm in 65 nm CMOS. Issue 6 (2nd June 2016) Authors: Zhang, Yuejun; Wang, Pengjun; Zhang, Xuelong; Weng, Xinqian; Yu, Zhiyi Journal: International journal of electronics Issue: Volume 103:Issue 6(2016) Page Start: 1056 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. A subgap density of states modeling for the transient characteristics in oxide-based thin-film transistors. (May 2016) Authors: Wang, Weiliang; Khan, Karim; Zhang, Xingye; Qin, Haiming; Jiang, Jun; Miao, Lijing; Jiang, Kemin; Wang, Pengjun; Dai, Mingzhi; Chu, Junhao Journal: Microelectronics and reliability Issue: Volume 60(2016) Page Start: 67 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗