0.67‐μm2 /bitcell two‐transistor leakage‐based physically unclonable function with native bit‐instability of 0.89% at 65 nm. Issue 23 (9th October 2020)

• Record Type: Journal Article
• Authors: Li, Gang; Wang, Pengjun; Ma, Xuejiao; Chen, Bo
• Is Part Of: Electronics letters. Volume 56:Issue 23(2020)
• Page Start: 1237
• Page End: 1239
• Publication Date: 2020-10-09
• Subjects: CMOS integrated circuits -- leakage currents -- amplifiers -- semiconductor device reliability; leakage‐current mismatch -- unique chip identification -- PUF -- best‐in‐class randomness -- low native BER -- native bit‐instability -- robust physically unclonable function -- secure key generation -- cross‐coupled amplifier -- two‐transistor leakage -- best‐in‐class uniqueness -- ultra‐small PUF cell -- CMOS intergated circuit -- size 65 nm; Electronics -- Periodicals; 621.381
• DOI: 10.1049/el.2020.1237
• Languages: English
• ISSNs: 0013-5194

Abstract

Abstract : A compact and robust physically unclonable function (PUF) for secure key generation is proposed. With the help of a cross‐coupled amplifier, the leakage‐current mismatch between the two transistors was digitised to produce a unique chip identification. The measurement results show that the proposed PUF has the best‐in‐class randomness and uniqueness, as well as the following features: (i) an ultra‐small PUF cell with a minimum feature size of 159 F 2, being the lowest reported to date in CMOS, (ii) a low native BER (bit‐instability) of 0.16% (0.89%) was measured at the golden condition, and (iii) an autocorrelation of 0.007 at 95% confidence was achieved.