1. Reliability Detection of Process-Induced Metallization Defects in GaAs Devices. Issue 1792 (18th May 2015) Authors: Kilgore, Steve H. Editors: Herrick, R.; Miyake, H.; Palacios, T.; Shiojima, K.; Ueda, O.; Chen, Y.; Liliental-Weber, Z.; Narayan, J.; Weber, E.R. Journal: MRS proceedings Issue: Issue 1792(2015) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Space Environments and Effects on CIGS Solar Cells and Modules. Issue 1792 (14th May 2015) Authors: Kawakita, Shirou; Imaizumi, Mitsuru; Kusawake, Hiroaki Editors: Herrick, R.; Miyake, H.; Palacios, T.; Shiojima, K.; Ueda, O.; Chen, Y.; Liliental-Weber, Z.; Narayan, J.; Weber, E.R. Journal: MRS proceedings Issue: Issue 1792(2015) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. White beam X-ray Diffraction Topography (WBXDT) Studies of Bridgman Grown CdZnTe Crystals. Issue 1792 (22nd May 2015) Authors: Babalola, Stephen; Uba, Samuel; Hossain, Anwar; Camarda, Giuseppe; James, Ralph; Montgomery, Trent Editors: Herrick, R.; Miyake, H.; Palacios, T.; Shiojima, K.; Ueda, O.; Chen, Y.; Liliental-Weber, Z.; Narayan, J.; Weber, E.R. Journal: MRS proceedings Issue: Issue 1792(2015) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Temperature induced degradation of InAlGaN multiple-quantum well UV-B LEDs. Issue 1792 (12th May 2015) Authors: Glaab, Johannes; Ploch, Christian; Kelz, Rico; Stölmacker, Christoph; Lapeyrade, Mickael; Ploch, Neysha Lobo; Rass, Jens; Kolbe, Tim; Einfeldt, Sven; Mehnke, Frank; Kuhn, Christian; Wernicke, Tim; Weyers, Markus; Kneissl, Michael Editors: Herrick, R.; Miyake, H.; Palacios, T.; Shiojima, K.; Ueda, O.; Chen, Y.; Liliental-Weber, Z.; Narayan, J.; Weber, E.R. Journal: MRS proceedings Issue: Issue 1792(2015) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Physical Mechanisms Affecting the Reliability of GaN-based High Electron Mobility Transistors. Issue 1792 (18th May 2015) Authors: Schrimpf, R. D.; Fleetwood, D. M.; Pantelides, S. T.; Puzyrev, Y.S.; Mukherjee, S.; Reed, R. A.; Speck, J. S.; Mishra, U. K. Editors: Herrick, R.; Miyake, H.; Palacios, T.; Shiojima, K.; Ueda, O.; Chen, Y.; Liliental-Weber, Z.; Narayan, J.; Weber, E.R. Journal: MRS proceedings Issue: Issue 1792(2015) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Effects of Electrical Stress and High-Energy Electron Irradiation on the InGaP/GaAs Heterojunction Phototransistor. Issue 1792 (11th May 2015) Authors: Than, Phuc Hong; Uchida, Kazuo; Makino, Takahiro; Ohshima, Takeshi; Nozaki, Shinji Editors: Herrick, R.; Miyake, H.; Palacios, T.; Shiojima, K.; Ueda, O.; Chen, Y.; Liliental-Weber, Z.; Narayan, J.; Weber, E.R. Journal: MRS proceedings Issue: Issue 1792(2015) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Impact of low dose gamma irradiation on electronic carrier transport in AlGaN/GaN High Electron Mobility Transistors. Issue 1792 (22nd May 2015) Authors: Yadav, Anupama; Flitsiyan, Elena; Chernyak, Leonid; Ren, Fan; Pearton, Stephen J.; Johnson, Jerry Wayne; Lubomirsky, Igor Editors: Herrick, R.; Miyake, H.; Palacios, T.; Shiojima, K.; Ueda, O.; Chen, Y.; Liliental-Weber, Z.; Narayan, J.; Weber, E.R. Journal: MRS proceedings Issue: Issue 1792(2015) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Study of Photoluminescence Properties of CuxO Thin Films Prepared by Reactive Radio Frequency Magnetron Sputtering. Issue 1792 (11th June 2015) Authors: Gan, Jiantuo; Galeckas, Augustinas; Venkatachalapathy, Vishnukanthan; Riise, Heine N.; Svensson, Bengt G.; Monakhov, Edouard V. Editors: Herrick, R.; Miyake, H.; Palacios, T.; Shiojima, K.; Ueda, O.; Chen, Y.; Liliental-Weber, Z.; Narayan, J.; Weber, E.R. Journal: MRS proceedings Issue: Issue 1792(2015) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Reliability and Degradation Mechanisms in High Power Broad-Area InGaAs-AlGaAs Strained Quantum Well Lasers. Issue 1792 (28th May 2015) Authors: Sin, Yongkun; Presser, Nathan; LaLumondiere, Stephen; Brodie, Miles; Lingley, Zachary; Ives, Neil; Foran, Brendan; Lotshaw, William; Moss, Steven C. Editors: Herrick, R.; Miyake, H.; Palacios, T.; Shiojima, K.; Ueda, O.; Chen, Y.; Liliental-Weber, Z.; Narayan, J.; Weber, E.R. Journal: MRS proceedings Issue: Issue 1792(2015) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Selectively Nucleated Lateral Crystallization for a Large Single-Grained Pb(Zr, Ti)O3 on Polycrystalline-Silicon Thin-Film Transistors for System-On-Glass Applications. Issue 1792 (16th June 2015) Authors: Park, Jae Hyo; Joo, Seung Ki Editors: Herrick, R.; Miyake, H.; Palacios, T.; Shiojima, K.; Ueda, O.; Chen, Y.; Liliental-Weber, Z.; Narayan, J.; Weber, E.R. Journal: MRS proceedings Issue: Issue 1792(2015) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗