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You searched for: Author/Creator Oliver, R. A.

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1. Characterization of buried interfaces using Ga Kα hard X-ray photoelectron spectroscopy (HAXPES). (9th May 2022)

3. Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors. (August 2014)

4. Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors. (August 2014)

5. High temperature stability in non‐polar (11$ \bar 2 $0) InGaN quantum dots: Exciton and biexciton dynamics. Issue 3 (4th March 2014)

7. Molecular beam epitaxy of free‐standing bulk wurtzite AlxGa1‐xN layers using a highly efficient RF plasma source. Issue 5 (25th February 2016)