Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors. (August 2014)
- Record Type:
- Journal Article
- Title:
- Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors. (August 2014)
- Main Title:
- Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors
- Authors:
- Trager-Cowan, C.
Naresh-Kumar, G.
Allehiani, N.
Kraeusel, S.
Hourahine, B.
Vespucci, S.
Thomson, D.
Bruckbauer, J.
Kusch, G.
Edwards, P. R.
Martin, R. W.
Mauder, C.
Day, A. P.
Winkelmann, A.
Vilalta-Clemente, A.
Wilkinson, A. J.
Parbrook, P. J.
Kappers, M. J.
Moram, M. A.
Oliver, R. A.
Humphreys, C. J.
Shields, P.
Le Boulbar, E. D.
Maneuski, D.
O'Shea, V.
Mingard, K. P. - Abstract:
- Is Part Of:
- Microscopy and microanalysis. Volume 20:Number 3(2014:Jun.)
- Journal:
- Microscopy and microanalysis
- Issue:
- Volume 20:Number 3(2014:Jun.)
- Issue Display:
- Volume 20, Issue 3 (2014)
- Year:
- 2014
- Volume:
- 20
- Issue:
- 3
- Issue Sort Value:
- 2014-0020-0003-0000
- Page Start:
- 1024
- Page End:
- 1025
- Publication Date:
- 2014-08
- Subjects:
- Microscopy -- Periodicals
Microchemistry -- Periodicals
502.82 - Journal URLs:
- https://academic.oup.com/mam ↗
http://journals.cambridge.org/action/displayJournal?jid=MAM ↗
http://link.springer.de/link/service/journals/10005/index.htm ↗
http://firstsearch.oclc.org ↗ - DOI:
- 10.1017/S1431927614006849 ↗
- Languages:
- English
- ISSNs:
- 1431-9276
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library HMNTS - ELD Digital store
- Ingest File:
- 3375.xml