1. 2D Electron Gas at the Interface of Atomic‐Layer‐Deposited Al2O3/TiO2 on SrTiO3 Single Crystal Substrate. (21st October 2018) Authors: Lee, Hyun Jae; Moon, Taehwan; An, Cheol Hyun; Hwang, Cheol Seong Journal: Advanced Electronic Materials Issue: Volume 5:Number 1(2019) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. 2D Electronics: Origin of the Threshold Voltage Shift in a Transistor with a 2D Electron Gas Channel at the Al2O3/SrTiO3 Interface (Adv. Electron. Mater. 6/2020). (4th June 2020) Authors: Moon, Taehwan; Lee, Hyun Jae; Hyun, Seung Dam; Kim, Baek Su; Kim, Ho Hyun; Hwang, Cheol Seong Journal: Advanced Electronic Materials Issue: Volume 6:Number 6(2020) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. A study on the wake-up effect of ferroelectric Hf0.5Zr0.5O2 films by pulse-switching measurement. Issue 3 (29th October 2015) Authors: Kim, Han Joon; Park, Min Hyuk; Kim, Yu Jin; Lee, Young Hwan; Moon, Taehwan; Kim, Keum Do; Hyun, Seung Dam; Hwang, Cheol Seong Journal: Nanoscale Issue: Volume 8:Issue 3(2016) Page Start: 1383 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Characterization of a 2D Electron Gas at the Interface of Atomic‐Layer Deposited Al2O3/ZnO Thin Films for a Field‐Effect Transistor. (4th December 2020) Authors: Lee, Hyun Jae; Moon, Taehwan; Hyun, Seung Dam; Kang, Sukin; Hwang, Cheol Seong Journal: Advanced Electronic Materials Issue: Volume 7:Number 1(2021) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Diode Property and Positive Temperature Coefficient of Resistance of Pt/Al2O3/Nb:SrTiO3. (19th September 2018) Authors: Moon, Taehwan; Lee, Hyun Jae; Kim, Keum Do; Lee, Young Hwan; Hyun, Seung Dam; Park, Hyeon Woo; Lee, Yong Bin; Kim, Baek Su; Hwang, Cheol Seong Journal: Advanced Electronic Materials Issue: Volume 4:Number 12(2018) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Effect of the annealing temperature of thin Hf0.3Zr0.7O2 films on their energy storage behavior. Issue 10 (11th August 2014) Authors: Park, Min Hyuk; Kim, Han Joon; Kim, Yu Jin; Moon, Taehwan; Kim, Keum Do; Hwang, Cheol Seong Journal: Physica status solidi Issue: Volume 8:Issue 10(2014:Oct.) Page Start: 857 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Ferroelectric properties and switching endurance of Hf0.5Zr0.5O2 films on TiN bottom and TiN or RuO2 top electrodes. Issue 6 (17th February 2014) Authors: Park, Min Hyuk; Kim, Han Joon; Kim, Yu Jin; Jeon, Woojin; Moon, Taehwan; Hwang, Cheol Seong Journal: Physica status solidi Issue: Volume 8:Issue 6(2014:Jun.) Page Start: 532 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Ferroelectricity and Antiferroelectricity of Doped Thin HfO2‐Based Films. (11th February 2015) Authors: Park, Min Hyuk; Lee, Young Hwan; Kim, Han Joon; Kim, Yu Jin; Moon, Taehwan; Kim, Keum Do; Müller, Johannes; Kersch, Alfred; Schroeder, Uwe; Mikolajick, Thomas; Hwang, Cheol Seong Journal: Advanced materials Issue: Volume 27:Number 11(2015) Page Start: 1811 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Giant Negative Electrocaloric Effects of Hf0.5Zr0.5O2 Thin Films. Issue 36 (4th July 2016) Authors: Park, Min Hyuk; Kim, Han Joon; Kim, Yu Jin; Moon, Taehwan; Kim, Keum Do; Lee, Young Hwan; Hyun, Seung Dam; Hwang, Cheol Seong Journal: Advanced materials Issue: Volume 28:Issue 36(2016) Page Start: 7956 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Hybrid Deep Learning Crystallographic Mapping of Polymorphic Phases in Polycrystalline Hf0.5Zr0.5O2 Thin Films. Issue 18 (3rd April 2022) Authors: Kim, Young‐Hoon; Yang, Sang‐Hyeok; Jeong, Myoungho; Jung, Min‐Hyoung; Yang, Daehee; Lee, Hyangsook; Moon, Taehwan; Heo, Jinseong; Jeong, Hu Young; Lee, Eunha; Kim, Young‐Min Journal: Small Issue: Volume 18:Issue 18(2022) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗