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You searched for: Author/Creator Lederer, Maximilian

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1. A Fully Integrated Ferroelectric Thin‐Film‐Transistor – Influence of Device Scaling on Threshold Voltage Compensation in Displays. (9th May 2021)

2. A Study on Imprint Behavior of Ferroelectric Hafnium Oxide Caused by High‐Temperature Annealing. Issue 7 (8th March 2023)

3. Back‐End‐of‐Line Compatible Low‐Temperature Furnace Anneal for Ferroelectric Hafnium Zirconium Oxide Formation. Issue 8 (26th February 2020)

4. Back‐End‐of‐Line Compatible Low‐Temperature Furnace Anneal for Ferroelectric Hafnium Zirconium Oxide Formation. Issue 8 (27th April 2020)

5. Megahertz‐rate ultrafast X‐ray scattering and holographic imaging at the European XFEL. (30th September 2022)

7. On the Origin of Wake‐Up and Antiferroelectric‐Like Behavior in Ferroelectric Hafnium Oxide. Issue 5 (17th May 2021)

9. On the Origin of Wake‐Up and Antiferroelectric‐Like Behavior in Ferroelectric Hafnium Oxide. Issue 5 (4th May 2021)